Update materials_science_and_engineering domain with 49 ontologies

README.md

@@ -7,7 +7,7 @@ tags:
 - OntoLearner
 - ontology-learning
 - materials_science_and_engineering
-pretty_name: Agricultural
+pretty_name: Materials Science And Engineering
 ---
 <div>
   <img  src="https://raw.githubusercontent.com/sciknoworg/OntoLearner/main/images/logo.png"  alt="OntoLearner"
@@ -15,8 +15,16 @@ pretty_name: Agricultural
   <h1 style="text-align: center; margin-top: 1em;">Materials Science And Engineering Domain Ontologies</h1>
 </div>
 
+<div align="center">
+  
+[![GitHub](https://img.shields.io/badge/GitHub-OntoLearner-blue?logo=github)](https://github.com/sciknoworg/OntoLearner)
+[![PyPI](https://img.shields.io/badge/PyPI-OntoLearner-blue?logo=pypi)](https://pypi.org/project/OntoLearner/)
+[![Documentation](https://img.shields.io/badge/Docs-ReadTheDocs-blue)](https://ontolearner.readthedocs.io/benchmarking/benchmark.html)
+
+</div>
+
 ## Overview
-Materials Science and Engineering is a multidisciplinary domain that focuses on the study and application of materials, emphasizing their structure, properties, processing, and performance in engineering contexts. This field is pivotal in advancing knowledge representation by systematically categorizing and interrelating complex material phenomena, enabling the development of innovative materials and technologies. Through the integration of computational, experimental, and theoretical approaches, it facilitates the design and optimization of materials for diverse industrial applications, thereby driving technological progress and sustainability.
+Materials Science and Engineering is a multidisciplinary domain that focuses on the study and application of materials, emphasizing their structure, properties, processing, and performance in engineering contexts. This field is pivotal for advancing knowledge representation, as it integrates principles from physics, chemistry, and engineering to innovate and optimize materials for diverse technological applications. By systematically categorizing and modeling material-related data, this domain facilitates the development of new materials and enhances the understanding of their behavior under various conditions.
 
 ## Ontologies
 | Ontology ID | Full Name | Classes | Properties | Last Updated |
@@ -29,7 +37,7 @@ Materials Science and Engineering is a multidisciplinary domain that focuses on
 | BVCO | Battery Value Chain Ontology (BVCO) | 262 | 6 | None|
 | CDCO | Crystallographic Defect Core Ontology (CDCO) | 7 | 2 | None|
 | CHAMEO | Characterisation Methodology Domain Ontology (CHAMEO) | 203 | 52 | 2024-04-12|
-| CIFCore | Crystallographic Information Framework (CIF) Core Dictionary (CIFCore) | 1182 | 0 | May 24, 2023|
+| CIFCore | Crystallographic Information Framework Core Dictionary (CIFCore) | 1182 | 0 | May 24, 2023|
 | CMSO | Computational Material Sample Ontology (CMSO) | 45 | 51 | None|
 | DISO | Dislocation Ontology (DISO) | 62 | 45 | 21.03.202|
 | DSIM | Dislocation Simulation and Model Ontology (DSIM) | 47 | 78 | 17.08.2023|
@@ -56,11 +64,10 @@ Materials Science and Engineering is a multidisciplinary domain that focuses on
 | MSEO | Materials Science and Engineering Ontology (MSEO) | 138 | 2 | None|
 | MSLE | Material Science Lab Equipment Ontology (MSLE) | 45 | 10 | Sep 15, 2022|
 | NanoMine | NanoMine Ontology (NanoMine) | 157 | 0 | None|
-| OIECharacterisation | Open Innovation Environment (OIE) domain ontologies, Characterisation module (OIECharacterisation) | 42 | 0 | None|
-| OIEManufacturing | Open Innovation Environment (OIE) domain ontologies, Manufacturing module (OIEManufacturing) | 222 | 3 | None|
-| OIEMaterials | Open Innovation Environment (OIE) domain ontologies, Materials module (OIEMaterials) | 119 | 0 | None|
-| OIEModels | Open Innovation Environment (OIE) domain ontologies, Models module (OIEModels) | 108 | 1 | None|
-| OIESoftware | Open Innovation Environment (OIE) domain ontologies, Software module (OIESoftware) | 155 | 0 | None|
+| OIEManufacturing | Open Innovation Environment Manufacturing (OIEManufacturing) | 222 | 3 | None|
+| OIEMaterials | Open Innovation Environment Materials (OIEMaterials) | 119 | 0 | None|
+| OIEModels | Open Innovation Environment Models (OIEModels) | 108 | 1 | None|
+| OIESoftware | Open Innovation Environment Software (OIESoftware) | 155 | 0 | None|
 | ONTORULE | Ontology for the Steel Domain (ONTORULE) | 24 | 37 | 2010-05-31|
 | PeriodicTable | Periodic Table of the Elements Ontology (PeriodicTable) | 6 | 13 | 2004/02/05|
 | Photovoltaics | EMMO Domain Ontology for Photovoltaics (Photovoltaics) | 47 | 3 | None|
@@ -69,8 +76,8 @@ Materials Science and Engineering is a multidisciplinary domain that focuses on
 | PODO | Point Defects Ontology (PODO) | 12 | 5 | None|
 | PRIMA | PRovenance Information in MAterials science (PRIMA) | 67 | 67 | 2024-01-29|
 | SSN | Semantic Sensor Network Ontology (SSN) | 22 | 38 | 2017-04-17|
-| SystemCapabilities | System capabilities, operating ranges, and survival ranges ontology (SystemCapabilities) | 25 | 8 | 2017-05-14|
-| VIMMP | Virtual Materials Marketplace (VIMMP) Ontologies | 1234 | 771 | 2021-01-02|
+| SystemCapabilities | System Capabilities Ontology (SystemCapabilities) | 25 | 8 | 2017-05-14|
+| VIMMP | Virtual Materials Marketplace Ontologies (VIMMP) | 1234 | 771 | 2021-01-02|
 
 ## Dataset Files
 Each ontology directory contains the following files:
@@ -81,5 +88,38 @@ Each ontology directory contains the following files:
 5. `<ontology_id>.rst` - Documentation describing the ontology
 
 ## Usage
-These datasets are intended for ontology learning research and applications.
+These datasets are intended for ontology learning research and applications. Here's how to use them with OntoLearner:
+
+```python
+from ontolearner.ontology import Wine
+from ontolearner.utils.train_test_split import train_test_split
+from ontolearner.learner_pipeline import LearnerPipeline
+
+ontology = Wine()
+ontology.load()  # Automatically downloads from Hugging Face
+
+# Extract the dataset
+data = ontology.extract()
+
+# Split into train and test sets
+train_data, test_data = train_test_split(data, test_size=0.2)
+
+# Create a learning pipeline (for RAG-based learning)
+pipeline = LearnerPipeline(
+    task="term-typing",  # Other options: "taxonomy-discovery" or "non-taxonomy-discovery"
+    retriever_id="sentence-transformers/all-MiniLM-L6-v2", 
+    llm_id="mistralai/Mistral-7B-Instruct-v0.1",
+    hf_token="your_huggingface_token"  # Only needed for gated models
+)
+
+# Train and evaluate
+results, metrics = pipeline.fit_predict_evaluate(
+    train_data=train_data,
+    test_data=test_data,
+    top_k=3,
+    test_limit=10
+)
+```
+
+For more detailed examples, see the [OntoLearner documentation](https://ontolearner.readthedocs.io/).
     

amontology/term_typings.json

@@ -1,412 +1,412 @@
 [
   {
-    "ID": "TT_b76dedb5",
-    "term": "LiMa_ConsolidationInitialCondition",
+    "ID": "TT_d4654e58",
+    "term": "LiMa_AdiabaticBoundaryCondition",
     "types": [
-      "ConsolidationInitialCondition"
+      "AdiabaticBC"
     ]
   },
   {
-    "ID": "TT_69cc095a",
-    "term": "LiMa_ScanningSpeed",
+    "ID": "TT_d036665a",
+    "term": "LiMa_PowderLayerThickness",
     "types": [
-      "ScanningSpeed"
+      "LayerThickness"
     ]
   },
   {
-    "ID": "TT_af188b3e",
-    "term": "TemperatureDependentDensityOfTheSolid",
+    "ID": "TT_541317e8",
+    "term": "LiMa_SideBoundaryCondition",
     "types": [
-      "ConsolidationModelingAssumption"
+      "SideBoundaryCondition"
     ]
   },
   {
-    "ID": "TT_44ed8a79",
-    "term": "SurfaceHeatAbsorption",
+    "ID": "TT_5bf552a4",
+    "term": "ConstantAbsorptivity",
     "types": [
-      "SurfaceDistributionOfAbsorbedHeat"
+      "BeerLambertLaw"
     ]
   },
   {
-    "ID": "TT_2305140b",
-    "term": "LiMa_LaserSurfaceHeatFlux",
+    "ID": "TT_6fb93ed6",
+    "term": "LiMa_HeatConductionModelingAssumption",
     "types": [
-      "SurfaceDistributionOfAbsorbedHeat"
+      "HeatTransferModelingAssumption"
     ]
   },
   {
-    "ID": "TT_62a0bca9",
-    "term": "LiMa_ConsolidationModel",
+    "ID": "TT_944d3ed8",
+    "term": "TemperatureDependentDensityOfTheSolid",
     "types": [
-      "ConsolidationByMeltingModel"
+      "ConsolidationModelingAssumption"
     ]
   },
   {
-    "ID": "TT_ac0cf798",
-    "term": "LiMa_InputHeatFlux",
+    "ID": "TT_65c7235e",
+    "term": "LiMa_PreheatTemperature",
     "types": [
-      "TopBoundaryCondition"
+      "InitialDistributionOfTemperature"
     ]
   },
   {
-    "ID": "TT_4f2c423d",
-    "term": "LiMa_TopBoundaryCondition",
+    "ID": "TT_b0d8cc41",
+    "term": "3_3DimensionalModel",
     "types": [
-      "TopBoundaryCondition"
+      "ThreeDimensional"
     ]
   },
   {
-    "ID": "TT_221d1776",
-    "term": "LiMa_SurfaceConvection",
+    "ID": "TT_045ddbbf",
+    "term": "LiMa_PhaseChangesAssumption",
     "types": [
-      "TopBoundaryCondition"
+      "PhaseTransformationAssumption"
     ]
   },
   {
-    "ID": "TT_f65660ce",
-    "term": "LiMa_Radiation",
+    "ID": "TT_d0d29d18",
+    "term": "LiMa_Emissivity",
     "types": [
-      "TopBoundaryCondition"
+      "Emissivity"
     ]
   },
   {
-    "ID": "TT_bbef04ab",
-    "term": "LiMa_RadiusOfTheLaserBeam",
+    "ID": "TT_45fa0a8a",
+    "term": "LiMa_IrradiationAbsorptionModel",
     "types": [
-      "BeamSize"
+      "IrradiationAbsorptionModel"
     ]
   },
   {
-    "ID": "TT_00c3619b",
-    "term": "LiMa_LaserPowderBedFusionProcess",
+    "ID": "TT_2503ecf1",
+    "term": "LiMa_ConsolidationModel",
     "types": [
-      "SelectiveLaserMelting"
+      "ConsolidationByMeltingModel"
     ]
   },
   {
-    "ID": "TT_4db66b93",
-    "term": "LiMa_Inconel625",
+    "ID": "TT_0bd8570b",
+    "term": "LiMa_InitialPowderPackingRatio",
     "types": [
-      "Material"
+      "InitialPowderDensity"
     ]
   },
   {
-    "ID": "TT_cec06e9d",
-    "term": "DeterministicLaserHeatFlux",
+    "ID": "TT_e01ca1e7",
+    "term": "LiMa_BoundaryCondition",
     "types": [
-      "DeterministicIrradiation"
+      "ThermalBoundaryCondition"
     ]
   },
   {
-    "ID": "TT_55f88a86",
-    "term": "LiMa_DensityOfThePowderBed",
+    "ID": "TT_bc82c908",
+    "term": "LiMa_IrradiationAbsorptionModelingAssumption",
     "types": [
-      "DensityDistribution"
+      "IrradiationAbsorptionModelingAssumption"
     ]
   },
   {
-    "ID": "TT_add278ab",
-    "term": "LiMa_PhaseChangesAssumption",
+    "ID": "TT_9ec17766",
+    "term": "LiMa_LaserSurfaceHeatFlux",
     "types": [
-      "PhaseTransformationAssumption"
+      "Prediction"
     ]
   },
   {
-    "ID": "TT_93e260e9",
-    "term": "GaussianSurfaceDistributionOfHeat",
+    "ID": "TT_b11cbb9b",
+    "term": "LiMa_TemperatureHistoryOutput",
     "types": [
-      "GaussianDistribution"
+      "Prediction"
     ]
   },
   {
-    "ID": "TT_abb21d4b",
-    "term": "LiMa_GaussianDistribution",
+    "ID": "TT_e76b91f1",
+    "term": "LiMa_SolidusTemperature",
     "types": [
-      "GaussianDistribution"
+      "SolidusTemperature"
     ]
   },
   {
-    "ID": "TT_9be1c354",
-    "term": "TemperatutreDependentPowderPackingRatio",
+    "ID": "TT_8a1f3a59",
+    "term": "LiMa_ThermalConductivityOfThePowderBed",
     "types": [
-      "LawOfPhysicsForConsolidation"
+      "ThermalConductivityInPowderBed"
     ]
   },
   {
-    "ID": "TT_b1d9f541",
-    "term": "LiMa_PreheatTemperature",
+    "ID": "TT_611712ab",
+    "term": "LiMa_LiquidusTemperature",
     "types": [
-      "InitialDistributionOfTemperature"
+      "LiquidusTemperature"
     ]
   },
   {
-    "ID": "TT_51fbcf0b",
-    "term": "LiMa_ThermalPhysicalProperty",
+    "ID": "TT_98a9203b",
+    "term": "LiMa_TemperatureHistoryOutput",
     "types": [
-      "HeatTransferProperty"
+      "TimeHistoryOfTemperature"
     ]
   },
   {
-    "ID": "TT_35dd3021",
-    "term": "LiMa_SideBoundaryCondition",
+    "ID": "TT_ed0fa1c0",
+    "term": "LiMa_ConsolidationPhysicalProperty",
     "types": [
-      "SideBoundaryCondition"
+      "ConsolidationPhysicalProperty"
     ]
   },
   {
-    "ID": "TT_ae69a060",
-    "term": "LiMa_PowderPackingRatio",
+    "ID": "TT_678ecfc1",
+    "term": "LiMa_HeatConductionModel",
     "types": [
-      "PackingDensity"
+      "HeatTransferModel"
     ]
   },
   {
-    "ID": "TT_99b52a25",
-    "term": "LiMa_AdiabaticBoundaryCondition",
+    "ID": "TT_6ae33503",
+    "term": "LiMa_ThermalModel",
     "types": [
-      "AdiabaticBC"
+      "HeatTransferModel"
     ]
   },
   {
-    "ID": "TT_7ddd16ce",
-    "term": "LiMa_Emissivity",
+    "ID": "TT_745743a0",
+    "term": "LiMa_SpecificHeatCapacity",
     "types": [
-      "Emissivity"
+      "ModelVariable"
     ]
   },
   {
-    "ID": "TT_47f8314f",
-    "term": "LiMa_InitialPowderPackingRatio",
+    "ID": "TT_7ba2fdac",
+    "term": "LiMa_MeltStateVariable",
     "types": [
-      "InitialPowderDensity"
+      "ModelVariable"
     ]
   },
   {
-    "ID": "TT_da4c8c5a",
-    "term": "LiMa_ThermalConductivityOfThePowderBed",
+    "ID": "TT_309d7258",
+    "term": "LiMa_TemperatureField",
     "types": [
-      "ThermalConductivityInPowderBed"
+      "ModelVariable"
     ]
   },
   {
-    "ID": "TT_6c02ecb8",
-    "term": "LiMa_ThermalModel",
+    "ID": "TT_981c183c",
+    "term": "TemperatureDependentFouriersLaw",
     "types": [
-      "HeatTransferModel"
+      "FouriersLaw"
     ]
   },
   {
-    "ID": "TT_bc84eb7b",
-    "term": "LiMa_HeatConductionModel",
+    "ID": "TT_d79804e3",
+    "term": "LiMa_ConsolidationInitialCondition",
     "types": [
-      "HeatTransferModel"
+      "ConsolidationInitialCondition"
     ]
   },
   {
-    "ID": "TT_c3cc3c9d",
-    "term": "LiMa_DensityOfThePowderBed",
+    "ID": "TT_9f312a73",
+    "term": "TemperatutreDependentPowderPackingRatio",
     "types": [
-      "ConsolidationModelPrediction"
+      "LawOfPhysicsForConsolidation"
     ]
   },
   {
-    "ID": "TT_5e51c3f5",
-    "term": "LiMa_HeatConductionPhenomenon",
+    "ID": "TT_23824e95",
+    "term": "LiMa_LaserPower",
     "types": [
-      "HeatTransfer"
+      "HeatSourcePower"
     ]
   },
   {
-    "ID": "TT_66bac9e8",
-    "term": "LiMa_IrradiationAbsorptionModel",
+    "ID": "TT_f92abcf0",
+    "term": "LiMa_PowderPackingRatio",
     "types": [
-      "IrradiationAbsorptionModel"
+      "PackingDensity"
     ]
   },
   {
-    "ID": "TT_bf13c2a5",
-    "term": "ConstantAbsorptivity",
+    "ID": "TT_710a7e3b",
+    "term": "LiMa_LaserPowderBedFusionProcess",
     "types": [
-      "BeerLambertLaw"
+      "SelectiveLaserMelting"
     ]
   },
   {
-    "ID": "TT_07206cf0",
-    "term": "LiMa_LaserSurfaceHeatFlux",
+    "ID": "TT_e04050af",
+    "term": "LiMa_Inconel625",
     "types": [
-      "Prediction"
+      "Material"
     ]
   },
   {
-    "ID": "TT_4728d46b",
-    "term": "LiMa_TemperatureHistoryOutput",
+    "ID": "TT_613867e0",
+    "term": "LiMa_DensityOfThePowderBed",
     "types": [
-      "Prediction"
+      "ConsolidationModelPrediction"
     ]
   },
   {
-    "ID": "TT_13617844",
-    "term": "LiMa_BoundaryCondition",
+    "ID": "TT_528d6c5d",
+    "term": "LiMa_ThermalConductivityOfTheBulkMaterial",
     "types": [
-      "ThermalBoundaryCondition"
+      "ThermalConductivityOfTheBulkMaterial"
     ]
   },
   {
-    "ID": "TT_7f1612f6",
-    "term": "LiMa_HeatConductionInitialCondition",
+    "ID": "TT_aefc9d9e",
+    "term": "ConstantPreheatTemperature",
     "types": [
       "ThermalInitialCondition"
     ]
   },
   {
-    "ID": "TT_d54fdfc2",
-    "term": "ConstantPreheatTemperature",
+    "ID": "TT_42ddb7f4",
+    "term": "LiMa_HeatConductionInitialCondition",
     "types": [
       "ThermalInitialCondition"
     ]
   },
   {
-    "ID": "TT_724be478",
-    "term": "LiMa_LaserPower",
+    "ID": "TT_7f073dbd",
+    "term": "LiMa_TopBoundaryCondition",
     "types": [
-      "HeatSourcePower"
+      "TopBoundaryCondition"
     ]
   },
   {
-    "ID": "TT_eb604e07",
-    "term": "LiMa_IrradiationAbsorptionModelingAssumption",
+    "ID": "TT_35b2f7a8",
+    "term": "LiMa_Radiation",
     "types": [
-      "IrradiationAbsorptionModelingAssumption"
+      "TopBoundaryCondition"
     ]
   },
   {
-    "ID": "TT_da211d70",
-    "term": "LiMa_ConsolidationPhysicalProperty",
+    "ID": "TT_915cbc63",
+    "term": "LiMa_InputHeatFlux",
     "types": [
-      "ConsolidationPhysicalProperty"
+      "TopBoundaryCondition"
     ]
   },
   {
-    "ID": "TT_de932b4c",
-    "term": "LiMa_BottomBoundaryCondition",
+    "ID": "TT_e6d8934a",
+    "term": "LiMa_SurfaceConvection",
     "types": [
-      "BottomBoundaryCondition"
+      "TopBoundaryCondition"
     ]
   },
   {
-    "ID": "TT_8f98db74",
-    "term": "LiMa_DensityOfTheSolidMaterial",
+    "ID": "TT_9b482085",
+    "term": "LiMa_ThermalPhysicalProperty",
     "types": [
-      "DensityOfBulkMaterial"
+      "HeatTransferProperty"
     ]
   },
   {
-    "ID": "TT_9f3002fc",
-    "term": "LiMa_HeatConductionModelingAssumption",
+    "ID": "TT_e8ec27db",
+    "term": "LiMa_DensityOfTheSolidMaterial",
     "types": [
-      "HeatTransferModelingAssumption"
+      "DensityOfBulkMaterial"
     ]
   },
   {
-    "ID": "TT_1005ec63",
-    "term": "3_3DimensionalModel",
+    "ID": "TT_99cb4937",
+    "term": "DeterministicLaserHeatFlux",
     "types": [
-      "ThreeDimensional"
+      "DeterministicIrradiation"
     ]
   },
   {
-    "ID": "TT_697bdb15",
-    "term": "LiMa_LiquidusTemperature",
+    "ID": "TT_216ec659",
+    "term": "LiMa_GaussianDistribution",
     "types": [
-      "LiquidusTemperature"
+      "GaussianDistribution"
     ]
   },
   {
-    "ID": "TT_cdbc29c8",
-    "term": "LiMa_SolidusTemperature",
+    "ID": "TT_ebf5ba39",
+    "term": "GaussianSurfaceDistributionOfHeat",
     "types": [
-      "SolidusTemperature"
+      "GaussianDistribution"
     ]
   },
   {
-    "ID": "TT_09cb1713",
-    "term": "LiMa_ThermalConductivityOfTheBulkMaterial",
+    "ID": "TT_5d809d29",
+    "term": "LiMa_HeatConductionPhenomenon",
     "types": [
-      "ThermalConductivityOfTheBulkMaterial"
+      "HeatTransfer"
     ]
   },
   {
-    "ID": "TT_b5597a17",
-    "term": "LiMa_TemperatureHistoryOutput",
+    "ID": "TT_bd9b0fe2",
+    "term": "LiMa_PeakTemperature",
     "types": [
-      "TimeHistoryOfTemperature"
+      "ProcessSignature"
     ]
   },
   {
-    "ID": "TT_26636780",
-    "term": "LiMa_PowderLayerThickness",
+    "ID": "TT_d9bba8ee",
+    "term": "LiMa_LaserPBF-ProcessSignature",
     "types": [
-      "LayerThickness"
+      "ProcessSignature"
     ]
   },
   {
-    "ID": "TT_77835d9b",
-    "term": "LiMa_MeltStateVariable",
+    "ID": "TT_1e068487",
+    "term": "LiMa_ScanningSpeed",
     "types": [
-      "ModelVariable"
+      "ScanningSpeed"
     ]
   },
   {
-    "ID": "TT_86dc0b89",
-    "term": "LiMa_TemperatureField",
+    "ID": "TT_338997c6",
+    "term": "LiMa_DensityOfThePowderBed",
     "types": [
-      "ModelVariable"
+      "DensityDistribution"
     ]
   },
   {
-    "ID": "TT_d83eca05",
-    "term": "LiMa_SpecificHeatCapacity",
+    "ID": "TT_b1c65929",
+    "term": "LiMa_RadiusOfTheLaserBeam",
     "types": [
-      "ModelVariable"
+      "BeamSize"
     ]
   },
   {
-    "ID": "TT_294298b0",
-    "term": "TemperatureDependentFouriersLaw",
+    "ID": "TT_6d4bd39d",
+    "term": "LiMa_LaserSurfaceHeatFlux",
     "types": [
-      "FouriersLaw"
+      "SurfaceDistributionOfAbsorbedHeat"
     ]
   },
   {
-    "ID": "TT_b4420b49",
-    "term": "LiMa_ConvectionHeatTransferCoefficient",
+    "ID": "TT_eec40bc5",
+    "term": "SurfaceHeatAbsorption",
     "types": [
-      "PhysicalProperty"
+      "SurfaceDistributionOfAbsorbedHeat"
     ]
   },
   {
-    "ID": "TT_134b24bd",
+    "ID": "TT_6fdb2925",
     "term": "LiMa_AbsorptionCoeffcientOfThePowderLayer",
     "types": [
       "PhysicalProperty"
     ]
   },
   {
-    "ID": "TT_bce2c77b",
-    "term": "LiMa_PeakTemperature",
+    "ID": "TT_f9596ed1",
+    "term": "LiMa_ConvectionHeatTransferCoefficient",
     "types": [
-      "ProcessSignature"
+      "PhysicalProperty"
     ]
   },
   {
-    "ID": "TT_10403bed",
-    "term": "LiMa_LaserPBF-ProcessSignature",
+    "ID": "TT_0e67b610",
+    "term": "LiMa_BottomBoundaryCondition",
     "types": [
-      "ProcessSignature"
+      "BottomBoundaryCondition"
     ]
   },
   {
-    "ID": "TT_88d4bb8d",
+    "ID": "TT_bc6a4b07",
     "term": "LiMa_LaserPBF-ProcessParameter",
     "types": [
       "ProcessParameter"

amontology/type_non_taxonomic_relations.json

@@ -16,33 +16,33 @@
   ],
   "non_taxonomies": [
     {
-      "ID": "NR_167b8ea9",
-      "head": "Equation",
-      "tail": "ModelingAssumption",
+      "ID": "NR_00e858d2",
+      "head": "Continuum",
+      "tail": "Particle",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_b1617da6",
-      "head": "SurfaceDistributionOfAbsorbedHeat",
-      "tail": "VolumetricDistributionOfAbsorbedHeat",
+      "ID": "NR_53fe66f8",
+      "head": "DeterministicIrradiation",
+      "tail": "StochasticIrradiation",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_7b5ef311",
-      "head": "Continuum",
-      "tail": "Particle",
+      "ID": "NR_d1efb592",
+      "head": "SurfaceDistributionOfAbsorbedHeat",
+      "tail": "VolumetricDistributionOfAbsorbedHeat",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_e3732375",
+      "ID": "NR_0ba4f4eb",
       "head": "ThreeDimensional",
       "tail": "TwoDimensional",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_8f56a81f",
-      "head": "DeterministicIrradiation",
-      "tail": "StochasticIrradiation",
+      "ID": "NR_da6fd123",
+      "head": "Equation",
+      "tail": "ModelingAssumption",
       "relation": "disjointWith"
     }
   ]

asmo/term_typings.json

@@ -1,212 +1,212 @@
 [
   {
-    "ID": "TT_3c085274",
-    "term": "Third-order polynomial fit",
+    "ID": "TT_2504fdea",
+    "term": "Isoenthalpic–Isobaric Ensemble",
     "types": [
-      "Equation of State Fit"
+      "Statistical Ensemble"
     ]
   },
   {
-    "ID": "TT_de390bad",
-    "term": "Vinet",
+    "ID": "TT_cdc0ba60",
+    "term": "Grand Canonical Ensemble",
     "types": [
-      "Equation of State Fit"
+      "Statistical Ensemble"
     ]
   },
   {
-    "ID": "TT_44f51bf0",
-    "term": "Birch-Murnaghan",
+    "ID": "TT_f93a8fff",
+    "term": "Microcanonical Ensemble",
     "types": [
-      "Equation of State Fit"
+      "Statistical Ensemble"
     ]
   },
   {
-    "ID": "TT_b8cce995",
-    "term": "Murnaghan",
+    "ID": "TT_daf8ee77",
+    "term": "Isothermal–Isobaric Ensemble",
     "types": [
-      "Equation of State Fit"
+      "Statistical Ensemble"
     ]
   },
   {
-    "ID": "TT_f8661efc",
-    "term": "Parrinello-Rahman",
+    "ID": "TT_aef7a5db",
+    "term": "Canonical Ensemble",
     "types": [
-      "Barostat"
+      "Statistical Ensemble"
     ]
   },
   {
-    "ID": "TT_f0d60806",
-    "term": "Berendsen Barostat",
+    "ID": "TT_e509a750",
+    "term": "Cell Shape Relaxation",
     "types": [
-      "Barostat"
+      "Relaxation Degrees of Freedom"
     ]
   },
   {
-    "ID": "TT_197aa60d",
-    "term": "Andersen Barostat",
+    "ID": "TT_78c1f340",
+    "term": "Cell Volume Relaxation",
     "types": [
-      "Barostat"
+      "Relaxation Degrees of Freedom"
     ]
   },
   {
-    "ID": "TT_9e67bbf7",
-    "term": "Langevin",
+    "ID": "TT_7a09956f",
+    "term": "Atomic Position Relaxation",
     "types": [
-      "Thermostat"
+      "Relaxation Degrees of Freedom"
     ]
   },
   {
-    "ID": "TT_c54b0d56",
-    "term": "Andersen Thermostat",
+    "ID": "TT_fd176099",
+    "term": "Gamma-Centered KPoint Mesh",
     "types": [
-      "Thermostat"
+      "KPoint Mesh"
     ]
   },
   {
-    "ID": "TT_65f7acbe",
-    "term": "Berendsen Thermostat",
+    "ID": "TT_43fe1bb3",
+    "term": "Monkhorst Pack KPoint Mesh",
     "types": [
-      "Thermostat"
+      "KPoint Mesh"
     ]
   },
   {
-    "ID": "TT_5867e1f8",
-    "term": "Bussi-Donadio-Parrinello",
+    "ID": "TT_7aede6af",
+    "term": "Explicit KPoint Mesh",
     "types": [
-      "Thermostat"
+      "KPoint Mesh"
     ]
   },
   {
-    "ID": "TT_0eb753c1",
-    "term": "Nose-Hoover",
+    "ID": "TT_f604bc3e",
+    "term": "Periodicity in Z-direction",
     "types": [
-      "Thermostat"
+      "Periodic Boundary Condition"
     ]
   },
   {
-    "ID": "TT_ee6af87d",
-    "term": "Velocity Rescaling",
+    "ID": "TT_b99f244b",
+    "term": "Periodicity in Y-direction",
     "types": [
-      "Thermostat"
+      "Periodic Boundary Condition"
     ]
   },
   {
-    "ID": "TT_5f9893e7",
-    "term": "Isoenthalpic–Isobaric Ensemble",
+    "ID": "TT_f34d27f9",
+    "term": "Periodicity in X-direction",
     "types": [
-      "Statistical Ensemble"
+      "Periodic Boundary Condition"
     ]
   },
   {
-    "ID": "TT_be208d2e",
-    "term": "Grand Canonical Ensemble",
+    "ID": "TT_ebd28165",
+    "term": "Murnaghan",
     "types": [
-      "Statistical Ensemble"
+      "Equation of State Fit"
     ]
   },
   {
-    "ID": "TT_b5325ca6",
-    "term": "Isothermal–Isobaric Ensemble",
+    "ID": "TT_e28001ee",
+    "term": "Third-order polynomial fit",
     "types": [
-      "Statistical Ensemble"
+      "Equation of State Fit"
     ]
   },
   {
-    "ID": "TT_5d0f65db",
-    "term": "Canonical Ensemble",
+    "ID": "TT_fcf2001e",
+    "term": "Vinet",
     "types": [
-      "Statistical Ensemble"
+      "Equation of State Fit"
     ]
   },
   {
-    "ID": "TT_0f3d237f",
-    "term": "Microcanonical Ensemble",
+    "ID": "TT_5018f077",
+    "term": "Birch-Murnaghan",
     "types": [
-      "Statistical Ensemble"
+      "Equation of State Fit"
     ]
   },
   {
-    "ID": "TT_fda2394c",
-    "term": "Periodicity in Y-direction",
+    "ID": "TT_e00bee3b",
+    "term": "Substitute Atom",
     "types": [
-      "Periodic Boundary Condition"
+      "Point Defect Creation"
     ]
   },
   {
-    "ID": "TT_bcf42522",
-    "term": "Periodicity in Z-direction",
+    "ID": "TT_2c8282ff",
+    "term": "Delete Atom",
     "types": [
-      "Periodic Boundary Condition"
+      "Point Defect Creation"
     ]
   },
   {
-    "ID": "TT_35721f97",
-    "term": "Periodicity in X-direction",
+    "ID": "TT_93ef1224",
+    "term": "Add Atom",
     "types": [
-      "Periodic Boundary Condition"
+      "Point Defect Creation"
     ]
   },
   {
-    "ID": "TT_b140e4b6",
-    "term": "Explicit KPoint Mesh",
+    "ID": "TT_ed6d2f95",
+    "term": "Langevin",
     "types": [
-      "KPoint Mesh"
+      "Thermostat"
     ]
   },
   {
-    "ID": "TT_58ee1eec",
-    "term": "Monkhorst Pack KPoint Mesh",
+    "ID": "TT_8fa813ba",
+    "term": "Berendsen Thermostat",
     "types": [
-      "KPoint Mesh"
+      "Thermostat"
     ]
   },
   {
-    "ID": "TT_d691ee6d",
-    "term": "Gamma-Centered KPoint Mesh",
+    "ID": "TT_f4bbbf44",
+    "term": "Nose-Hoover",
     "types": [
-      "KPoint Mesh"
+      "Thermostat"
     ]
   },
   {
-    "ID": "TT_6c80e847",
-    "term": "Substitute Atom",
+    "ID": "TT_475d8a34",
+    "term": "Velocity Rescaling",
     "types": [
-      "Point Defect Creation"
+      "Thermostat"
     ]
   },
   {
-    "ID": "TT_4b314f89",
-    "term": "Delete Atom",
+    "ID": "TT_3a572871",
+    "term": "Andersen Thermostat",
     "types": [
-      "Point Defect Creation"
+      "Thermostat"
     ]
   },
   {
-    "ID": "TT_dcb77559",
-    "term": "Add Atom",
+    "ID": "TT_1af94a11",
+    "term": "Bussi-Donadio-Parrinello",
     "types": [
-      "Point Defect Creation"
+      "Thermostat"
     ]
   },
   {
-    "ID": "TT_f800f689",
-    "term": "Cell Shape Relaxation",
+    "ID": "TT_875f9ae7",
+    "term": "Parrinello-Rahman",
     "types": [
-      "Relaxation Degrees of Freedom"
+      "Barostat"
     ]
   },
   {
-    "ID": "TT_5b3288ff",
-    "term": "Cell Volume Relaxation",
+    "ID": "TT_b1fa7c3a",
+    "term": "Berendsen Barostat",
     "types": [
-      "Relaxation Degrees of Freedom"
+      "Barostat"
     ]
   },
   {
-    "ID": "TT_be911261",
-    "term": "Atomic Position Relaxation",
+    "ID": "TT_692631f5",
+    "term": "Andersen Barostat",
     "types": [
-      "Relaxation Degrees of Freedom"
+      "Barostat"
     ]
   }
 ]

asmo/type_non_taxonomic_relations.json

@@ -11,13 +11,13 @@
   ],
   "non_taxonomies": [
     {
-      "ID": "NR_4fa89b96",
+      "ID": "NR_369cfce7",
       "head": "Molecular Statics",
       "tail": "Molecular Dynamics",
       "relation": "seeAlso"
     },
     {
-      "ID": "NR_ba4701ea",
+      "ID": "NR_a7379348",
       "head": "Activity",
       "tail": "Entity",
       "relation": "disjointWith"

asmo/type_taxonomies.json

@@ -1,583 +1,583 @@
 {
   "types": [
-    "KPoint Mesh",
-    "Simulation",
-    "Structure Manipulation",
-    "Simulation Parameter",
-    "Length",
-    "Total Energy",
-    "Free Energy",
-    "Hybrid Functional",
-    "Energy",
-    "Local Density Approximation",
-    "Addition",
-    "Force",
-    "Density Functional Theory",
+    "Hybrid Meta Generalized Gradient Approximation",
+    "Bulk Modulus",
+    "Molecular Statics",
     "Agent",
-    "Shear",
-    "Simulation Run Time",
-    "Thermodynamic Free Energy",
-    "Generalized Gradient Approximation",
-    "Potential Energy",
-    "SoftwareAgent",
-    "Simulation Cell Length",
+    "Embedded Atom Model",
+    "Free Energy",
     "Hybrid Generalized Gradient Approximation",
-    "Mass",
+    "Simulation Cell Volume",
+    "Division",
+    "Formation Energy",
+    "Volume",
+    "Time",
+    "Meta Generalized Gradient Approximation",
     "Molecular Dynamics",
-    "Spatial Transformation",
-    "Multiplication",
-    "Poisson's Ratio",
-    "Force Field",
+    "Simulation Algorithm",
     "Helmholtz Free Energy",
-    "Mathematical Operation",
-    "Quasi-Harmonic Approximation",
-    "Physical Quantity",
-    "Rotation",
-    "Bulk Modulus",
     "Exchange Correlation Energy Functional",
-    "Point Defect Creation",
-    "Embedded Atom Model",
-    "Exponentiation",
-    "Person",
-    "Stillinger-Weber Potential",
+    "Ab Initio Molecular Dynamics",
+    "Length",
+    "Equation of State Fit",
+    "Physical Quantity",
+    "Young’s Modulus",
+    "Number Of Ionic Steps",
     "Gibbs Free Energy",
-    "Periodic Boundary Condition",
-    "Activity",
-    "Free Energy Calculation",
-    "Time",
     "Simulation Time",
+    "Point Defect Creation",
     "Calculated Property",
-    "Interatomic Potential",
-    "Ab Initio Molecular Dynamics",
-    "Division",
-    "Computational Method",
-    "Output Parameter",
-    "Shear Modulus",
-    "Energy Cutoff",
-    "Modified Embedded Atom Model",
-    "Meta Generalized Gradient Approximation",
-    "Pressure",
-    "Simulation Algorithm",
-    "Temperature",
     "Barostat",
-    "Simulation Cell Volume",
-    "Formation Energy",
-    "Total Magnetic Moment",
-    "Time Step",
-    "Input Parameter",
+    "Structure Manipulation",
+    "Free Energy Calculation",
+    "Generalized Gradient Approximation",
+    "Interatomic Potential",
+    "Organization",
     "Kinetic Monte Carlo Method",
     "Monte Carlo Method",
-    "Kinetic Energy",
-    "Energy Calculation",
-    "Machine Learning Potential",
-    "Equation of State Fit",
+    "Modified Embedded Atom Model",
+    "Thermostat",
+    "Hybrid Functional",
+    "Thermodynamic Free Energy",
+    "Input Parameter",
+    "Mathematical Operation",
+    "Density Functional Theory",
+    "Person",
+    "Total Energy",
+    "Lennard-Jones Potential",
     "Thermodynamic Integration",
+    "Energy Cutoff",
+    "Force Field",
+    "Spatial Transformation",
+    "Activity",
+    "ANNNI Model",
+    "Total Magnetic Moment",
+    "Shear Modulus",
     "Subtraction",
+    "Rotation",
+    "Machine Learning Potential",
+    "Simulation Cell Length",
+    "Temperature",
+    "Force",
+    "Stillinger-Weber Potential",
+    "Mass",
     "Volume Range",
-    "Thermostat",
-    "Number Of Ionic Steps",
-    "Young’s Modulus",
-    "Volume",
-    "Lennard-Jones Potential",
-    "Molecular Statics",
+    "KPoint Mesh",
     "Translation",
-    "ANNNI Model",
-    "Hybrid Meta Generalized Gradient Approximation",
-    "Organization"
+    "Simulation Parameter",
+    "Energy",
+    "Output Parameter",
+    "Simulation",
+    "Local Density Approximation",
+    "Multiplication",
+    "Exponentiation",
+    "Kinetic Energy",
+    "Quasi-Harmonic Approximation",
+    "Computational Method",
+    "Poisson's Ratio",
+    "Periodic Boundary Condition",
+    "Time Step",
+    "Energy Calculation",
+    "Shear",
+    "Pressure",
+    "Addition",
+    "Potential Energy",
+    "SoftwareAgent",
+    "Simulation Run Time"
   ],
   "taxonomies": [
     {
-      "ID": "TR_d94cec63",
+      "ID": "TR_55fc38e4",
       "parent": "Simulation Algorithm",
       "child": "ANNNI Model"
     },
     {
-      "ID": "TR_300f5a41",
+      "ID": "TR_14b3ac77",
       "parent": "Simulation Algorithm",
       "child": "Barostat"
     },
     {
-      "ID": "TR_807d996a",
+      "ID": "TR_29c55948",
       "parent": "Simulation Algorithm",
       "child": "Equation of State Fit"
     },
     {
-      "ID": "TR_7af5f908",
+      "ID": "TR_fdf14bef",
       "parent": "Simulation Algorithm",
       "child": "Quasi-Harmonic Approximation"
     },
     {
-      "ID": "TR_22921564",
+      "ID": "TR_39adaad3",
       "parent": "Simulation Algorithm",
       "child": "Thermodynamic Integration"
     },
     {
-      "ID": "TR_abc49d53",
+      "ID": "TR_7ade7d1f",
       "parent": "Simulation Algorithm",
       "child": "Thermostat"
     },
     {
-      "ID": "TR_aa3011e0",
+      "ID": "TR_23952192",
       "parent": "Computational Method",
       "child": "Ab Initio Molecular Dynamics"
     },
     {
-      "ID": "TR_abba25ab",
+      "ID": "TR_dab52f81",
       "parent": "Computational Method",
       "child": "Density Functional Theory"
     },
     {
-      "ID": "TR_57c495f4",
+      "ID": "TR_8d829842",
       "parent": "Computational Method",
       "child": "Molecular Dynamics"
     },
     {
-      "ID": "TR_23297472",
+      "ID": "TR_bff31f77",
       "parent": "Computational Method",
       "child": "Molecular Statics"
     },
     {
-      "ID": "TR_f40fc14a",
+      "ID": "TR_fce43539",
       "parent": "Computational Method",
       "child": "Monte Carlo Method"
     },
     {
-      "ID": "TR_bbdef1e0",
+      "ID": "TR_5f90aeb0",
       "parent": "Mathematical Operation",
       "child": "Addition"
     },
     {
-      "ID": "TR_5fcab9ef",
+      "ID": "TR_a22c1a64",
       "parent": "Mathematical Operation",
       "child": "Division"
     },
     {
-      "ID": "TR_3f987a7e",
+      "ID": "TR_963b4799",
       "parent": "Mathematical Operation",
       "child": "Exponentiation"
     },
     {
-      "ID": "TR_665da266",
+      "ID": "TR_1497fc4b",
       "parent": "Mathematical Operation",
       "child": "Multiplication"
     },
     {
-      "ID": "TR_2f99b369",
+      "ID": "TR_b21d2df8",
       "parent": "Mathematical Operation",
       "child": "Subtraction"
     },
     {
-      "ID": "TR_7293f949",
+      "ID": "TR_75236c32",
       "parent": "Calculated Property",
       "child": "Bulk Modulus"
     },
     {
-      "ID": "TR_5648b552",
+      "ID": "TR_0093d3b3",
       "parent": "Calculated Property",
       "child": "Formation Energy"
     },
     {
-      "ID": "TR_f8401759",
+      "ID": "TR_bd7c53a7",
       "parent": "Energy",
       "child": "Formation Energy"
     },
     {
-      "ID": "TR_48ae0fd0",
+      "ID": "TR_20216cce",
       "parent": "Calculated Property",
       "child": "Kinetic Energy"
     },
     {
-      "ID": "TR_b303b98f",
+      "ID": "TR_58001315",
       "parent": "Energy",
       "child": "Kinetic Energy"
     },
     {
-      "ID": "TR_499f5440",
+      "ID": "TR_41d2e689",
       "parent": "Calculated Property",
       "child": "Poisson's Ratio"
     },
     {
-      "ID": "TR_7e5aa9b3",
+      "ID": "TR_0dfd49aa",
       "parent": "Calculated Property",
       "child": "Potential Energy"
     },
     {
-      "ID": "TR_fb038e60",
+      "ID": "TR_3ec6132a",
       "parent": "Energy",
       "child": "Potential Energy"
     },
     {
-      "ID": "TR_01dc8e1a",
+      "ID": "TR_10afaef8",
       "parent": "Calculated Property",
       "child": "Shear Modulus"
     },
     {
-      "ID": "TR_a8996310",
+      "ID": "TR_95e7b072",
       "parent": "Calculated Property",
       "child": "Simulation Cell Length"
     },
     {
-      "ID": "TR_cba90764",
+      "ID": "TR_79cf0d07",
       "parent": "Length",
       "child": "Simulation Cell Length"
     },
     {
-      "ID": "TR_9b5ec68b",
+      "ID": "TR_70c6da12",
       "parent": "Calculated Property",
       "child": "Simulation Cell Volume"
     },
     {
-      "ID": "TR_c7239ace",
+      "ID": "TR_d03bfe99",
       "parent": "Volume",
       "child": "Simulation Cell Volume"
     },
     {
-      "ID": "TR_2c381e61",
+      "ID": "TR_61f3f3e8",
       "parent": "Calculated Property",
       "child": "Thermodynamic Free Energy"
     },
     {
-      "ID": "TR_919c0839",
+      "ID": "TR_5e5655e4",
       "parent": "Energy",
       "child": "Thermodynamic Free Energy"
     },
     {
-      "ID": "TR_402250e7",
+      "ID": "TR_a8e774e8",
       "parent": "Calculated Property",
       "child": "Total Energy"
     },
     {
-      "ID": "TR_81aa6045",
+      "ID": "TR_fb14e54a",
       "parent": "Energy",
       "child": "Total Energy"
     },
     {
-      "ID": "TR_5d4cf582",
+      "ID": "TR_6fd0dba8",
       "parent": "Calculated Property",
       "child": "Total Magnetic Moment"
     },
     {
-      "ID": "TR_4965c381",
+      "ID": "TR_ad74cd6c",
       "parent": "Calculated Property",
       "child": "Young’s Modulus"
     },
     {
-      "ID": "TR_dc0c48ff",
+      "ID": "TR_e277c22b",
       "parent": "Interatomic Potential",
       "child": "Embedded Atom Model"
     },
     {
-      "ID": "TR_2ba6eeb4",
+      "ID": "TR_a1ef0d6a",
       "parent": "Interatomic Potential",
       "child": "Lennard-Jones Potential"
     },
     {
-      "ID": "TR_5ad2ea53",
+      "ID": "TR_76ecd667",
       "parent": "Interatomic Potential",
       "child": "Machine Learning Potential"
     },
     {
-      "ID": "TR_0e4b98d1",
+      "ID": "TR_ae0cada1",
       "parent": "Interatomic Potential",
       "child": "Modified Embedded Atom Model"
     },
     {
-      "ID": "TR_0e70a1e3",
+      "ID": "TR_ee8b5395",
       "parent": "Interatomic Potential",
       "child": "Force Field"
     },
     {
-      "ID": "TR_bfd16f70",
+      "ID": "TR_9c92f295",
       "parent": "Interatomic Potential",
       "child": "Stillinger-Weber Potential"
     },
     {
-      "ID": "TR_a080522f",
+      "ID": "TR_b2375152",
       "parent": "Physical Quantity",
       "child": "Energy"
     },
     {
-      "ID": "TR_fe6da0bf",
+      "ID": "TR_3247c731",
       "parent": "Physical Quantity",
       "child": "Force"
     },
     {
-      "ID": "TR_fdcb142c",
+      "ID": "TR_fb37ff5e",
       "parent": "Physical Quantity",
       "child": "Length"
     },
     {
-      "ID": "TR_6d8278d9",
+      "ID": "TR_e8c642a7",
       "parent": "Physical Quantity",
       "child": "Mass"
     },
     {
-      "ID": "TR_c4190ce1",
+      "ID": "TR_6052cb25",
       "parent": "Physical Quantity",
       "child": "Pressure"
     },
     {
-      "ID": "TR_ed5b8640",
+      "ID": "TR_dc48e9a6",
       "parent": "Physical Quantity",
       "child": "Temperature"
     },
     {
-      "ID": "TR_baf85424",
+      "ID": "TR_101b193e",
       "parent": "Physical Quantity",
       "child": "Time"
     },
     {
-      "ID": "TR_64485040",
+      "ID": "TR_e3b83c6a",
       "parent": "Physical Quantity",
       "child": "Volume"
     },
     {
-      "ID": "TR_983e7b3a",
+      "ID": "TR_5c97b348",
       "parent": "Simulation",
       "child": "Energy Calculation"
     },
     {
-      "ID": "TR_244ac7c8",
+      "ID": "TR_030088c8",
       "parent": "Simulation",
       "child": "Free Energy Calculation"
     },
     {
-      "ID": "TR_d61eb95d",
+      "ID": "TR_054b7b53",
       "parent": "Input Parameter",
       "child": "Energy Cutoff"
     },
     {
-      "ID": "TR_ffe6c842",
+      "ID": "TR_b810d109",
       "parent": "Input Parameter",
       "child": "KPoint Mesh"
     },
     {
-      "ID": "TR_2d0f9e6f",
+      "ID": "TR_38aadbcf",
       "parent": "Input Parameter",
       "child": "Number Of Ionic Steps"
     },
     {
-      "ID": "TR_40a54255",
+      "ID": "TR_0121e534",
       "parent": "Output Parameter",
       "child": "Number Of Ionic Steps"
     },
     {
-      "ID": "TR_da48a545",
+      "ID": "TR_058c43d6",
       "parent": "Input Parameter",
       "child": "Periodic Boundary Condition"
     },
     {
-      "ID": "TR_fef0b23b",
+      "ID": "TR_43bf248f",
       "parent": "Input Parameter",
       "child": "Time Step"
     },
     {
-      "ID": "TR_200c4134",
+      "ID": "TR_9645c292",
       "parent": "Input Parameter",
       "child": "Volume Range"
     },
     {
-      "ID": "TR_bdca7261",
+      "ID": "TR_0e7ac31f",
       "parent": "Calculated Property",
       "child": "Formation Energy"
     },
     {
-      "ID": "TR_938fc72f",
+      "ID": "TR_5a4df639",
       "parent": "Energy",
       "child": "Formation Energy"
     },
     {
-      "ID": "TR_7f8ed9fa",
+      "ID": "TR_741276f6",
       "parent": "Energy",
       "child": "Free Energy"
     },
     {
-      "ID": "TR_86b4943f",
+      "ID": "TR_2267926c",
       "parent": "Calculated Property",
       "child": "Kinetic Energy"
     },
     {
-      "ID": "TR_85e4f02f",
+      "ID": "TR_11ea0d68",
       "parent": "Energy",
       "child": "Kinetic Energy"
     },
     {
-      "ID": "TR_cd7bf271",
+      "ID": "TR_0aa9c68e",
       "parent": "Calculated Property",
       "child": "Potential Energy"
     },
     {
-      "ID": "TR_bd780e3d",
+      "ID": "TR_0e5c1d4d",
       "parent": "Energy",
       "child": "Potential Energy"
     },
     {
-      "ID": "TR_a51f389c",
+      "ID": "TR_fff6bd83",
       "parent": "Calculated Property",
       "child": "Thermodynamic Free Energy"
     },
     {
-      "ID": "TR_345fd2b7",
+      "ID": "TR_6d57c635",
       "parent": "Energy",
       "child": "Thermodynamic Free Energy"
     },
     {
-      "ID": "TR_b9785540",
+      "ID": "TR_bfde8b26",
       "parent": "Calculated Property",
       "child": "Total Energy"
     },
     {
-      "ID": "TR_2b742037",
+      "ID": "TR_0e5919b1",
       "parent": "Energy",
       "child": "Total Energy"
     },
     {
-      "ID": "TR_d3987714",
+      "ID": "TR_2e7e6888",
       "parent": "Thermodynamic Free Energy",
       "child": "Gibbs Free Energy"
     },
     {
-      "ID": "TR_b2581d70",
+      "ID": "TR_18eaef62",
       "parent": "Thermodynamic Free Energy",
       "child": "Helmholtz Free Energy"
     },
     {
-      "ID": "TR_4c4f86ed",
+      "ID": "TR_ec4c65b1",
       "parent": "Simulation Parameter",
       "child": "Input Parameter"
     },
     {
-      "ID": "TR_9a842ce4",
+      "ID": "TR_2024e023",
       "parent": "Simulation Parameter",
       "child": "Output Parameter"
     },
     {
-      "ID": "TR_19593bf2",
+      "ID": "TR_111a24d6",
       "parent": "Monte Carlo Method",
       "child": "Kinetic Monte Carlo Method"
     },
     {
-      "ID": "TR_e7bfb2e8",
+      "ID": "TR_6bc12c88",
       "parent": "Activity",
       "child": "Mathematical Operation"
     },
     {
-      "ID": "TR_431d4eb0",
+      "ID": "TR_adfa9aa6",
       "parent": "Activity",
       "child": "Simulation"
     },
     {
-      "ID": "TR_b992bcce",
+      "ID": "TR_40529a9f",
       "parent": "Activity",
       "child": "Structure Manipulation"
     },
     {
-      "ID": "TR_3bc6d62b",
+      "ID": "TR_831d24be",
       "parent": "Input Parameter",
       "child": "Number Of Ionic Steps"
     },
     {
-      "ID": "TR_19e16e19",
+      "ID": "TR_0908c316",
       "parent": "Output Parameter",
       "child": "Number Of Ionic Steps"
     },
     {
-      "ID": "TR_8934e3ab",
+      "ID": "TR_79a6bc78",
       "parent": "Structure Manipulation",
       "child": "Point Defect Creation"
     },
     {
-      "ID": "TR_1afb4f2f",
+      "ID": "TR_0dd854c5",
       "parent": "Structure Manipulation",
       "child": "Spatial Transformation"
     },
     {
-      "ID": "TR_514965cb",
+      "ID": "TR_36840fa0",
       "parent": "Spatial Transformation",
       "child": "Rotation"
     },
     {
-      "ID": "TR_bcd4c112",
+      "ID": "TR_acf50599",
       "parent": "Spatial Transformation",
       "child": "Shear"
     },
     {
-      "ID": "TR_26ebafa7",
+      "ID": "TR_ec07162b",
       "parent": "Spatial Transformation",
       "child": "Translation"
     },
     {
-      "ID": "TR_ed93545f",
+      "ID": "TR_2a3b02dc",
       "parent": "Calculated Property",
       "child": "Simulation Cell Length"
     },
     {
-      "ID": "TR_d9ee463b",
+      "ID": "TR_6ea64b28",
       "parent": "Length",
       "child": "Simulation Cell Length"
     },
     {
-      "ID": "TR_14adf3d6",
+      "ID": "TR_614f208f",
       "parent": "Calculated Property",
       "child": "Simulation Cell Volume"
     },
     {
-      "ID": "TR_b65190f4",
+      "ID": "TR_dd325687",
       "parent": "Volume",
       "child": "Simulation Cell Volume"
     },
     {
-      "ID": "TR_0164a1f4",
+      "ID": "TR_9f92465d",
       "parent": "Time",
       "child": "Simulation Run Time"
     },
     {
-      "ID": "TR_74d3d1ee",
+      "ID": "TR_77673a18",
       "parent": "Time",
       "child": "Simulation Time"
     },
     {
-      "ID": "TR_2d225a1b",
+      "ID": "TR_ad5981b7",
       "parent": "Agent",
       "child": "Organization"
     },
     {
-      "ID": "TR_6749b8e4",
+      "ID": "TR_80c50c55",
       "parent": "Agent",
       "child": "Person"
     },
     {
-      "ID": "TR_b9e9e2ae",
+      "ID": "TR_588b8fc4",
       "parent": "Agent",
       "child": "SoftwareAgent"
     },
     {
-      "ID": "TR_9091497a",
+      "ID": "TR_5b9d07b9",
       "parent": "Exchange Correlation Energy Functional",
       "child": "Generalized Gradient Approximation"
     },
     {
-      "ID": "TR_e4f87b46",
+      "ID": "TR_73a6dc1f",
       "parent": "Exchange Correlation Energy Functional",
       "child": "Hybrid Functional"
     },
     {
-      "ID": "TR_064da35d",
+      "ID": "TR_60af3b1d",
       "parent": "Exchange Correlation Energy Functional",
       "child": "Local Density Approximation"
     },
     {
-      "ID": "TR_246aa1f0",
+      "ID": "TR_ae3d0aa9",
       "parent": "Exchange Correlation Energy Functional",
       "child": "Meta Generalized Gradient Approximation"
     },
     {
-      "ID": "TR_eaaa064a",
+      "ID": "TR_68bd6083",
       "parent": "Hybrid Functional",
       "child": "Hybrid Generalized Gradient Approximation"
     },
     {
-      "ID": "TR_d58ed100",
+      "ID": "TR_0cca5848",
       "parent": "Hybrid Functional",
       "child": "Hybrid Meta Generalized Gradient Approximation"
     }

battinfo/term_typings.json

@@ -1,70 +1,70 @@
 [
   {
-    "ID": "TT_65e319fb",
-    "term": "Jesper Friis",
+    "ID": "TT_1504d410",
+    "term": "Francesca Lønstad Bleken",
     "types": [
       "Person"
     ]
   },
   {
-    "ID": "TT_d3963e97",
-    "term": "Francesca Lønstad Bleken",
+    "ID": "TT_606138bf",
+    "term": "Casper Welzel Andersen",
     "types": [
       "Person"
     ]
   },
   {
-    "ID": "TT_cbe629ff",
-    "term": "Eibar Flores",
+    "ID": "TT_654af627",
+    "term": "Simon Clark",
     "types": [
       "Person"
     ]
   },
   {
-    "ID": "TT_a9e690ad",
-    "term": "Casper Welzel Andersen",
+    "ID": "TT_1b5c4f73",
+    "term": "Eibar Flores",
     "types": [
       "Person"
     ]
   },
   {
-    "ID": "TT_c474022c",
-    "term": "Simon Clark",
+    "ID": "TT_5f58f146",
+    "term": "Jesper Friis",
     "types": [
       "Person"
     ]
   },
   {
-    "ID": "TT_0b7d89ba",
-    "term": "Jesper Friis",
+    "ID": "TT_cc65f531",
+    "term": "Francesca Lønstad Bleken",
     "types": [
       "Person"
     ]
   },
   {
-    "ID": "TT_af161cc3",
-    "term": "Francesca Lønstad Bleken",
+    "ID": "TT_110563cd",
+    "term": "Casper Welzel Andersen",
     "types": [
       "Person"
     ]
   },
   {
-    "ID": "TT_9e096c0d",
-    "term": "Eibar Flores",
+    "ID": "TT_4acab1df",
+    "term": "Simon Clark",
     "types": [
       "Person"
     ]
   },
   {
-    "ID": "TT_078020f9",
-    "term": "Casper Welzel Andersen",
+    "ID": "TT_b581dc84",
+    "term": "Eibar Flores",
     "types": [
       "Person"
     ]
   },
   {
-    "ID": "TT_13aff92e",
-    "term": "Simon Clark",
+    "ID": "TT_9e7bf805",
+    "term": "Jesper Friis",
     "types": [
       "Person"
     ]

battinfo/type_non_taxonomic_relations.json

@@ -10,15 +10,15 @@
   ],
   "non_taxonomies": [
     {
-      "ID": "NR_9c7f9493",
-      "head": "PreparedSample",
-      "tail": "ReferenceSample",
+      "ID": "NR_26817b61",
+      "head": "HardwareManufacturer",
+      "tail": "HardwareModel",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_ede3dc3f",
-      "head": "HardwareManufacturer",
-      "tail": "HardwareModel",
+      "ID": "NR_1f76e60e",
+      "head": "PreparedSample",
+      "tail": "ReferenceSample",
       "relation": "disjointWith"
     }
   ]

battinfo/type_taxonomies.json

@@ -1,1149 +1,1149 @@
 {
   "types": [
+    "ScanningTunnelingMicroscopy",
+    "HardwareModel",
+    "TensileTesting",
+    "DataFiltering",
+    "RawSample",
+    "XpsVariableKinetic",
+    "ThreePointBendingTesting",
+    "LightScattering",
+    "MechanicalTesting",
+    "Probe",
+    "ThermochemicalTesting",
+    "SamplePreparationByCutting",
+    "XrdGrazingIncidence",
+    "OpticalMicroscopy",
+    "Voltammetry",
+    "MeasurementSystemAdjustment",
+    "OutlierRemoval",
+    "Spectroscopy",
+    "CriticalAndSupercriticalChromatography",
+    "DynamicLightScattering",
+    "Electrogravimetry",
+    "DynamicMechanicalSpectroscopy",
+    "AtomicForceMicroscopy",
+    "AtomProbeTomography",
+    "SampleInspectionInstrument",
+    "HydrodynamicVoltammetry",
+    "SecondaryData",
+    "Fractography",
+    "Nanoindentation",
+    "FibDic",
+    "BrunauerEmmettTellerMethod",
+    "Calorimetry",
+    "IntermediateSample",
+    "HardnessTesting",
+    "WearTesting",
     "EnergyDispersiveXraySpectroscopy",
-    "SampleExtractionInstrument",
-    "LinearScanVoltammetry",
-    "CyclicChronopotentiometry",
-    "DeviceSample",
+    "Conductometry",
+    "DirectCoulometryAtControlledPotential",
+    "MercuryPorosimetry",
+    "CyclicVoltammetry",
+    "DifferentialRefractiveIndex",
+    "IsothermalMicrocalorimetry",
+    "AnodicStrippingVoltammetry",
+    "Ellipsometry",
+    "PseudoOpenCircuitVoltageMethod",
+    "CharacterisationData",
+    "Porosimetry",
+    "ACVoltammetry",
+    "Grinding",
+    "LinearChronopotentiometry",
     "ElectrochemicalTesting",
+    "PreparedSample",
+    "SampleInspection",
+    "CharacterisationProtocol",
+    "StepChronopotentiometry",
+    "CathodicStrippingVoltammetry",
+    "CyclicChronopotentiometry",
+    "CharacterisedSample",
+    "ShearOrTorsionTesting",
+    "ElectronBackscatterDiffraction",
+    "GammaSpectrometry",
+    "SamplePreparationInstrument",
+    "DirectCoulometryAtControlledCurrent",
+    "ConductometricTitration",
     "UltrasonicTesting",
-    "HPPC",
+    "FatigueTesting",
+    "Mounting",
+    "ConfocalMicroscopy",
+    "Dilatometry",
+    "SampleExtraction",
+    "DifferentialScanningCalorimetry",
+    "CharacterisationProcedure",
+    "Chronopotentiometry",
+    "DifferentialLinearPulseVoltammetry",
     "Signal",
-    "DataNormalisation",
+    "DirectCurrentInternalResistance",
+    "EnvironmentalScanningElectronMicroscopy",
+    "LinearScanVoltammetry",
+    "OpenCircuitHold",
+    "IonMobilitySpectrometry",
+    "AbrasiveStrippingVoltammetry",
+    "NormalPulseVoltammetry",
+    "Viscometry",
+    "CoulometricTitration",
     "ICI",
-    "ACVoltammetry",
-    "FourierTransformInfraredSpectroscopy",
-    "SampledDCPolarography",
-    "ScanningProbeMicroscopy",
-    "SampleExtraction",
-    "WearTesting",
-    "ChargeDistribution",
+    "PrimaryData",
+    "PulsedElectroacousticMethod",
+    "Polishing",
+    "ScanningElectronMicroscopy",
+    "ElectrochemicalImpedanceSpectroscopy",
+    "AlphaSpectrometry",
+    "PhotoluminescenceMicroscopy",
+    "Osmometry",
+    "Tomography",
     "Exafs",
-    "DifferentialScanningCalorimetry",
-    "Chronocoulometry",
+    "SecondaryIonMassSpectrometry",
     "Thermogravimetry",
-    "LinearChronopotentiometry",
-    "ThermochemicalTesting",
-    "AdsorptiveStrippingVoltammetry",
-    "SamplePreparationInstrument",
-    "StepChronopotentiometry",
-    "RawData",
-    "CharacterisationProcedure",
-    "GasAdsorptionPorosimetry",
+    "SampleExtractionByCutting",
+    "DielectricAndImpedanceSpectroscopy",
+    "Coulometry",
+    "Amperometry",
+    "ScanningProbeMicroscopy",
+    "Chronocoulometry",
+    "CreepTesting",
+    "Holder",
+    "DynamicMechanicalAnalysis",
+    "HardwareManufacturer",
     "SquareWaveVoltammetry",
-    "Synchrotron",
-    "VaporPressureDepressionOsmometry",
-    "CathodicStrippingVoltammetry",
+    "AnalyticalElectronMicroscopy",
+    "MembraneOsmometry",
+    "XrayDiffraction",
+    "ChargeDistribution",
+    "SamplePreparation",
+    "DeviceSample",
     "FreezingPointDepressionOsmometry",
-    "BrunauerEmmettTellerMethod",
-    "DataPreparation",
-    "Conductometry",
-    "Osmometry",
-    "CriticalAndSupercriticalChromatography",
-    "AnodicStrippingVoltammetry",
-    "CyclicVoltammetry",
-    "Spectroscopy",
-    "Impedimetry",
-    "CompressionTesting",
-    "DynamicLightScattering",
-    "IntermediateSample",
+    "Chromatography",
+    "ScanningKelvinProbe",
     "DifferentialStaircasePulseVoltammetry",
-    "RamanSpectroscopy",
-    "Viscometry",
-    "PseudoOpenCircuitVoltageMethod",
-    "Nanoindentation",
-    "SecondaryIonMassSpectrometry",
-    "DielectricAndImpedanceSpectroscopy",
-    "SecondaryData",
-    "OutlierRemoval",
-    "CharacterisationHardware",
-    "Ellipsometry",
-    "OpticalTesting",
-    "MechanicalTesting",
-    "StrippingVoltammetry",
-    "PhotoluminescenceMicroscopy",
-    "CalibrationData",
-    "SampleInspection",
-    "Chronoamperometry",
+    "IonChromatography",
+    "Nexafs",
     "CharacterisationMeasurementProcess",
+    "NeutronSpinEchoSpectroscopy",
+    "CharacterisationHardware",
+    "MassSpectrometry",
+    "ElectronProbeMicroanalysis",
     "CharacterisationHardwareSpecification",
-    "MembraneOsmometry",
-    "Polishing",
-    "Holder",
+    "FourierTransformInfraredSpectroscopy",
+    "UltravioletVisibleSpectroscopy",
     "XrayPowderDiffraction",
-    "Microscopy",
-    "ElectrochemicalPiezoelectricMicrogravimetry",
-    "PulsedElectroacousticMethod",
-    "Chromatography",
-    "HardwareModel",
-    "Sample",
-    "ElectronBackscatterDiffraction",
-    "DirectCoulometryAtControlledPotential",
-    "ScanningKelvinProbe",
-    "GalvanostaticIntermittentTitrationTechnique",
-    "Spectrometry",
-    "IsothermalMicrocalorimetry",
-    "AlphaSpectrometry",
-    "PrimaryData",
-    "ElectrochemicalImpedanceSpectroscopy",
-    "ConfocalMicroscopy",
-    "SamplePreparation",
-    "Chronopotentiometry",
-    "ShearOrTorsionTesting",
-    "ScanningTunnelingMicroscopy",
-    "OpenCircuitHold",
     "DCPolarography",
-    "DirectCurrentInternalResistance",
-    "IonMobilitySpectrometry",
-    "ElectronProbeMicroanalysis",
-    "MassSpectrometry",
     "CharacterisationTechnique",
-    "Coulometry",
-    "DynamicMechanicalSpectroscopy",
-    "HydrodynamicVoltammetry",
-    "Profilometry",
-    "DirectCoulometryAtControlledCurrent",
-    "Probe",
-    "MercuryPorosimetry",
-    "DifferentialLinearPulseVoltammetry",
-    "DataFiltering",
-    "DynamicMechanicalAnalysis",
-    "Potentiometry",
-    "MeasurementSystemAdjustment",
-    "DifferentialPulseVoltammetry",
-    "XrayDiffraction",
-    "Voltammetry",
+    "Dielectrometry",
     "TransmissionElectronMicroscopy",
-    "CharacterisationProtocol",
-    "EnvironmentalScanningElectronMicroscopy",
-    "CharacterisedSample",
-    "FieldEmissionScanningElectronMicroscopy",
+    "ReferenceSample",
+    "VoltammetryAtARotatingDiskElectrode",
+    "CalibrationProcess",
+    "ScanningAugerElectronMicroscopy",
+    "Detector",
     "CharacterisationMeasurementInstrument",
-    "HardnessTesting",
-    "ThreePointBendingTesting",
-    "AbrasiveStrippingVoltammetry",
-    "Dilatometry",
-    "Fractography",
+    "SampleExtractionInstrument",
+    "CompressionTesting",
+    "OpticalTesting",
+    "Synchrotron",
+    "NuclearMagneticResonance",
+    "VaporPressureDepressionOsmometry",
+    "FieldEmissionScanningElectronMicroscopy",
+    "CalibrationData",
+    "RamanSpectroscopy",
+    "Sample",
+    "AdsorptiveStrippingVoltammetry",
+    "Microscopy",
+    "HPPC",
+    "GasAdsorptionPorosimetry",
+    "Impedimetry",
+    "Spectrometry",
     "DifferentialThermalAnalysis",
-    "XrdGrazingIncidence",
-    "CharacterisationData",
-    "ScanningAugerElectronMicroscopy",
-    "FatigueTesting",
-    "PotentiometricStrippingAnalysis",
-    "AtomicForceMicroscopy",
-    "XpsVariableKinetic",
-    "Calorimetry",
-    "CreepTesting",
-    "LightScattering",
-    "SampleInspectionInstrument",
-    "DifferentialRefractiveIndex",
-    "Electrogravimetry",
-    "SamplePreparationByCutting",
-    "Dielectrometry",
-    "TensileTesting",
-    "UltravioletVisibleSpectroscopy",
-    "NormalPulseVoltammetry",
-    "RawSample",
-    "Nexafs",
-    "VoltammetryAtARotatingDiskElectrode",
-    "Amperometry",
-    "OpticalMicroscopy",
-    "Grinding",
-    "HardwareManufacturer",
-    "FibDic",
+    "StrippingVoltammetry",
+    "DataNormalisation",
+    "DataPreparation",
+    "Potentiometry",
+    "Profilometry",
+    "RawData",
+    "SampledDCPolarography",
+    "DifferentialPulseVoltammetry",
+    "Chronoamperometry",
     "Milling",
-    "NuclearMagneticResonance",
-    "ScanningElectronMicroscopy",
-    "CoulometricTitration",
-    "ConductometricTitration",
-    "ReferenceSample",
-    "AtomProbeTomography",
-    "Porosimetry",
+    "GalvanostaticIntermittentTitrationTechnique",
+    "PotentiometricStrippingAnalysis",
     "ScatteringAndDiffraction",
-    "CalibrationProcess",
-    "NeutronSpinEchoSpectroscopy",
-    "Mounting",
-    "SampleExtractionByCutting",
-    "Detector",
-    "GammaSpectrometry",
-    "AnalyticalElectronMicroscopy",
-    "Tomography",
-    "PreparedSample",
-    "IonChromatography"
+    "ElectrochemicalPiezoelectricMicrogravimetry"
   ],
   "taxonomies": [
     {
-      "ID": "TR_24d7ecd0",
+      "ID": "TR_6f152155",
       "parent": "CharacterisationData",
       "child": "RawData"
     },
     {
-      "ID": "TR_146324d5",
+      "ID": "TR_30719b7c",
       "parent": "CharacterisationHardware",
       "child": "CharacterisationMeasurementInstrument"
     },
     {
-      "ID": "TR_0af07655",
+      "ID": "TR_b0cdbe4a",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_ca115c3a",
+      "ID": "TR_2f38be9d",
       "parent": "Sample",
       "child": "DeviceSample"
     },
     {
-      "ID": "TR_b6b8653e",
+      "ID": "TR_4932a744",
       "parent": "Voltammetry",
       "child": "ACVoltammetry"
     },
     {
-      "ID": "TR_5ec77944",
+      "ID": "TR_3b3b86cd",
       "parent": "Voltammetry",
       "child": "AbrasiveStrippingVoltammetry"
     },
     {
-      "ID": "TR_eb45a8a5",
+      "ID": "TR_0ea0f175",
       "parent": "Voltammetry",
       "child": "CyclicVoltammetry"
     },
     {
-      "ID": "TR_d6620278",
+      "ID": "TR_23536d7e",
       "parent": "Voltammetry",
       "child": "DCPolarography"
     },
     {
-      "ID": "TR_be00ce0f",
+      "ID": "TR_048be8cd",
       "parent": "Voltammetry",
       "child": "DifferentialPulseVoltammetry"
     },
     {
-      "ID": "TR_564c087f",
+      "ID": "TR_1e5c3042",
       "parent": "Voltammetry",
       "child": "HydrodynamicVoltammetry"
     },
     {
-      "ID": "TR_7432e506",
+      "ID": "TR_5ef66c42",
       "parent": "Voltammetry",
       "child": "LinearScanVoltammetry"
     },
     {
-      "ID": "TR_052fa4b0",
+      "ID": "TR_96373c77",
       "parent": "Voltammetry",
       "child": "NormalPulseVoltammetry"
     },
     {
-      "ID": "TR_acf5acac",
+      "ID": "TR_5d2340fb",
       "parent": "Voltammetry",
       "child": "PotentiometricStrippingAnalysis"
     },
     {
-      "ID": "TR_7c30f326",
+      "ID": "TR_4b9bce55",
       "parent": "Voltammetry",
       "child": "SquareWaveVoltammetry"
     },
     {
-      "ID": "TR_e7eb5c9b",
+      "ID": "TR_283317fb",
       "parent": "Voltammetry",
       "child": "StrippingVoltammetry"
     },
     {
-      "ID": "TR_72969dfe",
+      "ID": "TR_0318a54c",
       "parent": "StrippingVoltammetry",
       "child": "AdsorptiveStrippingVoltammetry"
     },
     {
-      "ID": "TR_b36f6216",
+      "ID": "TR_4565e051",
       "parent": "StrippingVoltammetry",
       "child": "AnodicStrippingVoltammetry"
     },
     {
-      "ID": "TR_e20bf767",
+      "ID": "TR_86f0cfd7",
       "parent": "StrippingVoltammetry",
       "child": "CathodicStrippingVoltammetry"
     },
     {
-      "ID": "TR_7e9084da",
+      "ID": "TR_603229ef",
       "parent": "Spectrometry",
       "child": "AlphaSpectrometry"
     },
     {
-      "ID": "TR_2c2f01c8",
+      "ID": "TR_e0d25cb5",
       "parent": "Spectrometry",
       "child": "GammaSpectrometry"
     },
     {
-      "ID": "TR_7ab5ea26",
+      "ID": "TR_a54af18d",
       "parent": "Spectrometry",
       "child": "IonMobilitySpectrometry"
     },
     {
-      "ID": "TR_7b820db6",
+      "ID": "TR_c19559f2",
       "parent": "Spectrometry",
       "child": "MassSpectrometry"
     },
     {
-      "ID": "TR_cf858519",
+      "ID": "TR_ad0bd839",
       "parent": "Spectrometry",
       "child": "SecondaryIonMassSpectrometry"
     },
     {
-      "ID": "TR_78045549",
+      "ID": "TR_98e11e33",
       "parent": "ElectrochemicalTesting",
       "child": "Amperometry"
     },
     {
-      "ID": "TR_ba747a75",
+      "ID": "TR_90e9a3ce",
       "parent": "ElectrochemicalTesting",
       "child": "Conductometry"
     },
     {
-      "ID": "TR_6a8eea41",
+      "ID": "TR_0d7a7a69",
       "parent": "ElectrochemicalTesting",
       "child": "Coulometry"
     },
     {
-      "ID": "TR_58bdedab",
+      "ID": "TR_12fec897",
       "parent": "ElectrochemicalTesting",
       "child": "Dielectrometry"
     },
     {
-      "ID": "TR_267bc54d",
+      "ID": "TR_c7501d86",
       "parent": "ElectrochemicalTesting",
       "child": "Electrogravimetry"
     },
     {
-      "ID": "TR_a83451e4",
+      "ID": "TR_6c3b4b29",
       "parent": "ElectrochemicalTesting",
       "child": "Impedimetry"
     },
     {
-      "ID": "TR_88fb0ea8",
+      "ID": "TR_22ca4942",
       "parent": "ElectrochemicalTesting",
       "child": "Potentiometry"
     },
     {
-      "ID": "TR_212079cf",
+      "ID": "TR_97f87b11",
       "parent": "ElectrochemicalTesting",
       "child": "Voltammetry"
     },
     {
-      "ID": "TR_5469e4ae",
+      "ID": "TR_b66212cb",
       "parent": "Microscopy",
       "child": "AnalyticalElectronMicroscopy"
     },
     {
-      "ID": "TR_5f7c0dbd",
+      "ID": "TR_32ddd524",
       "parent": "Microscopy",
       "child": "AtomicForceMicroscopy"
     },
     {
-      "ID": "TR_23e266dc",
+      "ID": "TR_a3eb83a9",
       "parent": "Microscopy",
       "child": "ConfocalMicroscopy"
     },
     {
-      "ID": "TR_b14b4a49",
+      "ID": "TR_e5933b5d",
       "parent": "Microscopy",
       "child": "ElectronProbeMicroanalysis"
     },
     {
-      "ID": "TR_aa18030c",
+      "ID": "TR_ed4358b8",
       "parent": "Microscopy",
       "child": "EnvironmentalScanningElectronMicroscopy"
     },
     {
-      "ID": "TR_72ef319b",
+      "ID": "TR_bdd7e598",
       "parent": "Microscopy",
       "child": "FieldEmissionScanningElectronMicroscopy"
     },
     {
-      "ID": "TR_e7ae7bd2",
+      "ID": "TR_d8e6cf79",
       "parent": "Microscopy",
       "child": "OpticalMicroscopy"
     },
     {
-      "ID": "TR_632f974e",
+      "ID": "TR_d4d6c8dd",
       "parent": "Microscopy",
       "child": "PhotoluminescenceMicroscopy"
     },
     {
-      "ID": "TR_1e871bcd",
+      "ID": "TR_f4abec70",
       "parent": "Microscopy",
       "child": "ScanningAugerElectronMicroscopy"
     },
     {
-      "ID": "TR_98a061e0",
+      "ID": "TR_fccb4b8d",
       "parent": "Microscopy",
       "child": "ScanningElectronMicroscopy"
     },
     {
-      "ID": "TR_10393ca5",
+      "ID": "TR_2a2c96ac",
       "parent": "Microscopy",
       "child": "ScanningKelvinProbe"
     },
     {
-      "ID": "TR_3de76166",
+      "ID": "TR_274e5eaf",
       "parent": "Microscopy",
       "child": "ScanningProbeMicroscopy"
     },
     {
-      "ID": "TR_7949b91f",
+      "ID": "TR_24f1098b",
       "parent": "Microscopy",
       "child": "ScanningTunnelingMicroscopy"
     },
     {
-      "ID": "TR_3d3ae7ac",
+      "ID": "TR_98c80a5e",
       "parent": "Microscopy",
       "child": "TransmissionElectronMicroscopy"
     },
     {
-      "ID": "TR_89c461f9",
+      "ID": "TR_ac9b5dbd",
       "parent": "Tomography",
       "child": "AtomProbeTomography"
     },
     {
-      "ID": "TR_67b0e05c",
+      "ID": "TR_7821c1f5",
       "parent": "GasAdsorptionPorosimetry",
       "child": "BrunauerEmmettTellerMethod"
     },
     {
-      "ID": "TR_212b0bfc",
+      "ID": "TR_873c0a70",
       "parent": "CharacterisationData",
       "child": "CalibrationData"
     },
     {
-      "ID": "TR_fdd8c817",
+      "ID": "TR_51db3912",
       "parent": "CharacterisationData",
       "child": "PrimaryData"
     },
     {
-      "ID": "TR_ee2535c6",
+      "ID": "TR_6d8e1187",
       "parent": "CharacterisationData",
       "child": "RawData"
     },
     {
-      "ID": "TR_948be8f5",
+      "ID": "TR_a7ca0a4e",
       "parent": "CharacterisationData",
       "child": "SecondaryData"
     },
     {
-      "ID": "TR_0e85edbe",
+      "ID": "TR_06dd5493",
       "parent": "CharacterisationData",
       "child": "Signal"
     },
     {
-      "ID": "TR_fae9924f",
+      "ID": "TR_e9a5f45e",
       "parent": "CharacterisationProcedure",
       "child": "CalibrationProcess"
     },
     {
-      "ID": "TR_a5f52e77",
+      "ID": "TR_d85a1ac1",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_5d314413",
+      "ID": "TR_59c4b34d",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationProtocol"
     },
     {
-      "ID": "TR_36ae1109",
+      "ID": "TR_0ecd1321",
       "parent": "CharacterisationProcedure",
       "child": "MeasurementSystemAdjustment"
     },
     {
-      "ID": "TR_0c6a9803",
+      "ID": "TR_f56d363d",
       "parent": "CharacterisationProcedure",
       "child": "SampleExtraction"
     },
     {
-      "ID": "TR_9c73dbc2",
+      "ID": "TR_b5729cb8",
       "parent": "CharacterisationProcedure",
       "child": "SampleInspection"
     },
     {
-      "ID": "TR_1135cba4",
+      "ID": "TR_4adfdd5d",
       "parent": "CharacterisationProcedure",
       "child": "SamplePreparation"
     },
     {
-      "ID": "TR_8d5f423e",
+      "ID": "TR_d3ae0c9e",
       "parent": "CharacterisationProcedure",
       "child": "CalibrationProcess"
     },
     {
-      "ID": "TR_57ab730e",
+      "ID": "TR_75c82a5a",
       "parent": "CharacterisationProcedure",
       "child": "CalibrationProcess"
     },
     {
-      "ID": "TR_e51f00b8",
+      "ID": "TR_9d9a33a9",
       "parent": "CharacterisationProcedure",
       "child": "CalibrationProcess"
     },
     {
-      "ID": "TR_ac4a7ed2",
+      "ID": "TR_9b2673f9",
       "parent": "CharacterisationProcedure",
       "child": "CalibrationProcess"
     },
     {
-      "ID": "TR_853e5363",
+      "ID": "TR_9a8229bc",
       "parent": "ThermochemicalTesting",
       "child": "Calorimetry"
     },
     {
-      "ID": "TR_f9b9c36a",
+      "ID": "TR_e22dbea9",
       "parent": "ThermochemicalTesting",
       "child": "DifferentialScanningCalorimetry"
     },
     {
-      "ID": "TR_0cb4faaf",
+      "ID": "TR_353165f1",
       "parent": "ThermochemicalTesting",
       "child": "DifferentialThermalAnalysis"
     },
     {
-      "ID": "TR_e7dd1abb",
+      "ID": "TR_14f77e77",
       "parent": "ThermochemicalTesting",
       "child": "IsothermalMicrocalorimetry"
     },
     {
-      "ID": "TR_e34936f6",
+      "ID": "TR_564b31c2",
       "parent": "ThermochemicalTesting",
       "child": "Thermogravimetry"
     },
     {
-      "ID": "TR_44bafdce",
+      "ID": "TR_850210ba",
       "parent": "CharacterisationHardwareSpecification",
       "child": "HardwareManufacturer"
     },
     {
-      "ID": "TR_ca3d6687",
+      "ID": "TR_38912689",
       "parent": "CharacterisationHardwareSpecification",
       "child": "HardwareModel"
     },
     {
-      "ID": "TR_abbde6ad",
+      "ID": "TR_c1379a71",
       "parent": "CharacterisationHardware",
       "child": "CharacterisationMeasurementInstrument"
     },
     {
-      "ID": "TR_209341b0",
+      "ID": "TR_731b1f7d",
       "parent": "CharacterisationHardware",
       "child": "Detector"
     },
     {
-      "ID": "TR_0cb3014d",
+      "ID": "TR_2c89f2b5",
       "parent": "CharacterisationHardware",
       "child": "Holder"
     },
     {
-      "ID": "TR_fc46ae63",
+      "ID": "TR_e7a859c2",
       "parent": "CharacterisationHardware",
       "child": "Probe"
     },
     {
-      "ID": "TR_71bc7647",
+      "ID": "TR_56c94bc1",
       "parent": "CharacterisationHardware",
       "child": "SampleExtractionInstrument"
     },
     {
-      "ID": "TR_98f0d9f3",
+      "ID": "TR_6b806d92",
       "parent": "CharacterisationHardware",
       "child": "SampleInspectionInstrument"
     },
     {
-      "ID": "TR_45fee2e0",
+      "ID": "TR_f351ba7d",
       "parent": "CharacterisationHardware",
       "child": "SamplePreparationInstrument"
     },
     {
-      "ID": "TR_db595e90",
+      "ID": "TR_a709d845",
       "parent": "CharacterisationHardware",
       "child": "CharacterisationMeasurementInstrument"
     },
     {
-      "ID": "TR_1a45ae8c",
+      "ID": "TR_7bc57696",
       "parent": "CharacterisationHardware",
       "child": "CharacterisationMeasurementInstrument"
     },
     {
-      "ID": "TR_236d7051",
+      "ID": "TR_54f2d147",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_a443c615",
+      "ID": "TR_1dffb948",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_3c75e8b9",
+      "ID": "TR_0d37ca3e",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_b056f9ef",
+      "ID": "TR_fcd0dc8b",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_d076b002",
+      "ID": "TR_0b60bbb7",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_02a14ef3",
+      "ID": "TR_1c9d7865",
       "parent": "Sample",
       "child": "CharacterisedSample"
     },
     {
-      "ID": "TR_b19e5c46",
+      "ID": "TR_f8e65222",
       "parent": "Sample",
       "child": "DeviceSample"
     },
     {
-      "ID": "TR_07f49b38",
+      "ID": "TR_40e2720c",
       "parent": "Sample",
       "child": "IntermediateSample"
     },
     {
-      "ID": "TR_0d655dfd",
+      "ID": "TR_4cdb3888",
       "parent": "Sample",
       "child": "PreparedSample"
     },
     {
-      "ID": "TR_98fa0247",
+      "ID": "TR_4f4fc4da",
       "parent": "Sample",
       "child": "RawSample"
     },
     {
-      "ID": "TR_5c8458ab",
+      "ID": "TR_b92f6e2f",
       "parent": "Sample",
       "child": "ReferenceSample"
     },
     {
-      "ID": "TR_740b8ac8",
+      "ID": "TR_86059cb9",
       "parent": "CharacterisationTechnique",
       "child": "ChargeDistribution"
     },
     {
-      "ID": "TR_ab798397",
+      "ID": "TR_db6f12c9",
       "parent": "CharacterisationTechnique",
       "child": "Chromatography"
     },
     {
-      "ID": "TR_32402128",
+      "ID": "TR_9e52db17",
       "parent": "CharacterisationTechnique",
       "child": "Dilatometry"
     },
     {
-      "ID": "TR_e10b0813",
+      "ID": "TR_95491892",
       "parent": "CharacterisationTechnique",
       "child": "MechanicalTesting"
     },
     {
-      "ID": "TR_17ce54d9",
+      "ID": "TR_f1a079ea",
       "parent": "CharacterisationTechnique",
       "child": "Microscopy"
     },
     {
-      "ID": "TR_07aee71b",
+      "ID": "TR_a0fd0495",
       "parent": "CharacterisationTechnique",
       "child": "OpticalTesting"
     },
     {
-      "ID": "TR_d0f1d61d",
+      "ID": "TR_ccd3635a",
       "parent": "CharacterisationTechnique",
       "child": "Osmometry"
     },
     {
-      "ID": "TR_c82be07c",
+      "ID": "TR_17bc808e",
       "parent": "CharacterisationTechnique",
       "child": "Porosimetry"
     },
     {
-      "ID": "TR_42ecab55",
+      "ID": "TR_d5f2567a",
       "parent": "CharacterisationTechnique",
       "child": "Profilometry"
     },
     {
-      "ID": "TR_20aa5fff",
+      "ID": "TR_fb5f3eeb",
       "parent": "CharacterisationTechnique",
       "child": "ScatteringAndDiffraction"
     },
     {
-      "ID": "TR_e7af883d",
+      "ID": "TR_9e4998bb",
       "parent": "CharacterisationTechnique",
       "child": "Spectrometry"
     },
     {
-      "ID": "TR_7c7a76fd",
+      "ID": "TR_523cbe29",
       "parent": "CharacterisationTechnique",
       "child": "Spectroscopy"
     },
     {
-      "ID": "TR_9cd678f7",
+      "ID": "TR_80e4a952",
       "parent": "CharacterisationTechnique",
       "child": "ThermochemicalTesting"
     },
     {
-      "ID": "TR_948014a1",
+      "ID": "TR_bf124749",
       "parent": "CharacterisationTechnique",
       "child": "Tomography"
     },
     {
-      "ID": "TR_5c8b6f5e",
+      "ID": "TR_a5dd14cf",
       "parent": "CharacterisationTechnique",
       "child": "UltrasonicTesting"
     },
     {
-      "ID": "TR_dfd61103",
+      "ID": "TR_e1bfcb43",
       "parent": "CharacterisationTechnique",
       "child": "Viscometry"
     },
     {
-      "ID": "TR_2b57ba31",
+      "ID": "TR_c514a743",
       "parent": "Amperometry",
       "child": "Chronoamperometry"
     },
     {
-      "ID": "TR_9740f6b4",
+      "ID": "TR_2ebed597",
       "parent": "Coulometry",
       "child": "Chronocoulometry"
     },
     {
-      "ID": "TR_98ebb076",
+      "ID": "TR_27bfbc89",
       "parent": "Coulometry",
       "child": "CoulometricTitration"
     },
     {
-      "ID": "TR_91a9926f",
+      "ID": "TR_60004a61",
       "parent": "Coulometry",
       "child": "DirectCoulometryAtControlledCurrent"
     },
     {
-      "ID": "TR_4a5ed7a6",
+      "ID": "TR_c1268014",
       "parent": "Coulometry",
       "child": "DirectCoulometryAtControlledPotential"
     },
     {
-      "ID": "TR_50adfca8",
+      "ID": "TR_54584e01",
       "parent": "Potentiometry",
       "child": "Chronopotentiometry"
     },
     {
-      "ID": "TR_fe530e4a",
+      "ID": "TR_3b3f9c91",
       "parent": "Potentiometry",
       "child": "OpenCircuitHold"
     },
     {
-      "ID": "TR_a08bd58c",
+      "ID": "TR_1ffb6773",
       "parent": "MechanicalTesting",
       "child": "CompressionTesting"
     },
     {
-      "ID": "TR_b55018b5",
+      "ID": "TR_5bc07784",
       "parent": "MechanicalTesting",
       "child": "CreepTesting"
     },
     {
-      "ID": "TR_f7efa8c6",
+      "ID": "TR_e64bba9e",
       "parent": "MechanicalTesting",
       "child": "DynamicMechanicalAnalysis"
     },
     {
-      "ID": "TR_97ed2624",
+      "ID": "TR_8bfc9d8a",
       "parent": "MechanicalTesting",
       "child": "FatigueTesting"
     },
     {
-      "ID": "TR_aeaca2ed",
+      "ID": "TR_1595a57e",
       "parent": "MechanicalTesting",
       "child": "FibDic"
     },
     {
-      "ID": "TR_e3bd645e",
+      "ID": "TR_aa387b02",
       "parent": "MechanicalTesting",
       "child": "HardnessTesting"
     },
     {
-      "ID": "TR_5dfaf1f5",
+      "ID": "TR_09b5064d",
       "parent": "MechanicalTesting",
       "child": "Nanoindentation"
     },
     {
-      "ID": "TR_e9d3cc3b",
+      "ID": "TR_113dc9a1",
       "parent": "MechanicalTesting",
       "child": "ShearOrTorsionTesting"
     },
     {
-      "ID": "TR_adc439fc",
+      "ID": "TR_7f5e36f6",
       "parent": "MechanicalTesting",
       "child": "TensileTesting"
     },
     {
-      "ID": "TR_aa9df4f0",
+      "ID": "TR_3f729d12",
       "parent": "MechanicalTesting",
       "child": "ThreePointBendingTesting"
     },
     {
-      "ID": "TR_c4ef6e20",
+      "ID": "TR_40cf6d98",
       "parent": "MechanicalTesting",
       "child": "WearTesting"
     },
     {
-      "ID": "TR_4800d0e6",
+      "ID": "TR_8ae44bd2",
       "parent": "Conductometry",
       "child": "ConductometricTitration"
     },
     {
-      "ID": "TR_8baa4884",
+      "ID": "TR_724839e1",
       "parent": "Chromatography",
       "child": "CriticalAndSupercriticalChromatography"
     },
     {
-      "ID": "TR_bea8eb56",
+      "ID": "TR_9d1a31f2",
       "parent": "Chromatography",
       "child": "IonChromatography"
     },
     {
-      "ID": "TR_ea435ed6",
+      "ID": "TR_5afb50dd",
       "parent": "Chronopotentiometry",
       "child": "CyclicChronopotentiometry"
     },
     {
-      "ID": "TR_55d28296",
+      "ID": "TR_31c1fb63",
       "parent": "Chronopotentiometry",
       "child": "DirectCurrentInternalResistance"
     },
     {
-      "ID": "TR_f22b071a",
+      "ID": "TR_98293406",
       "parent": "Chronopotentiometry",
       "child": "GalvanostaticIntermittentTitrationTechnique"
     },
     {
-      "ID": "TR_bb9b79e7",
+      "ID": "TR_8af94c8c",
       "parent": "Chronopotentiometry",
       "child": "HPPC"
     },
     {
-      "ID": "TR_0c83fd4e",
+      "ID": "TR_15070cd7",
       "parent": "Chronopotentiometry",
       "child": "ICI"
     },
     {
-      "ID": "TR_9aa1967c",
+      "ID": "TR_74f9ca2a",
       "parent": "Chronopotentiometry",
       "child": "LinearChronopotentiometry"
     },
     {
-      "ID": "TR_b87effe7",
+      "ID": "TR_90c0ec66",
       "parent": "Chronopotentiometry",
       "child": "PseudoOpenCircuitVoltageMethod"
     },
     {
-      "ID": "TR_cc2ddec2",
+      "ID": "TR_ff930bb7",
       "parent": "Chronopotentiometry",
       "child": "StepChronopotentiometry"
     },
     {
-      "ID": "TR_6f099f42",
+      "ID": "TR_2a1dd409",
       "parent": "DataPreparation",
       "child": "DataFiltering"
     },
     {
-      "ID": "TR_48b836d4",
+      "ID": "TR_4c64a446",
       "parent": "DataPreparation",
       "child": "DataNormalisation"
     },
     {
-      "ID": "TR_f40622f0",
+      "ID": "TR_a013af8e",
       "parent": "Spectroscopy",
       "child": "DielectricAndImpedanceSpectroscopy"
     },
     {
-      "ID": "TR_fa5f5757",
+      "ID": "TR_40eec8d1",
       "parent": "Spectroscopy",
       "child": "DynamicMechanicalSpectroscopy"
     },
     {
-      "ID": "TR_6d4cceb2",
+      "ID": "TR_d2089661",
       "parent": "Spectroscopy",
       "child": "EnergyDispersiveXraySpectroscopy"
     },
     {
-      "ID": "TR_4b30c752",
+      "ID": "TR_1af2ca74",
       "parent": "Spectroscopy",
       "child": "Exafs"
     },
     {
-      "ID": "TR_d9b1477a",
+      "ID": "TR_908f3b93",
       "parent": "Spectroscopy",
       "child": "FourierTransformInfraredSpectroscopy"
     },
     {
-      "ID": "TR_b53ff2a6",
+      "ID": "TR_e171c0b9",
       "parent": "Spectroscopy",
       "child": "NeutronSpinEchoSpectroscopy"
     },
     {
-      "ID": "TR_da98c52b",
+      "ID": "TR_66a1536d",
       "parent": "Spectroscopy",
       "child": "Nexafs"
     },
     {
-      "ID": "TR_24192a00",
+      "ID": "TR_bf686b27",
       "parent": "Spectroscopy",
       "child": "NuclearMagneticResonance"
     },
     {
-      "ID": "TR_87f1adf5",
+      "ID": "TR_73365652",
       "parent": "Spectroscopy",
       "child": "RamanSpectroscopy"
     },
     {
-      "ID": "TR_037d1ae1",
+      "ID": "TR_9b6014ad",
       "parent": "Spectroscopy",
       "child": "UltravioletVisibleSpectroscopy"
     },
     {
-      "ID": "TR_97d6634c",
+      "ID": "TR_e25a5db7",
       "parent": "Spectroscopy",
       "child": "XpsVariableKinetic"
     },
     {
-      "ID": "TR_6d3a526e",
+      "ID": "TR_278d9512",
       "parent": "DifferentialPulseVoltammetry",
       "child": "DifferentialLinearPulseVoltammetry"
     },
     {
-      "ID": "TR_b9a395fa",
+      "ID": "TR_a8bd0d94",
       "parent": "DifferentialPulseVoltammetry",
       "child": "DifferentialStaircasePulseVoltammetry"
     },
     {
-      "ID": "TR_ab4feae4",
+      "ID": "TR_45c99dc5",
       "parent": "OpticalTesting",
       "child": "DifferentialRefractiveIndex"
     },
     {
-      "ID": "TR_af91eb42",
+      "ID": "TR_488f0886",
       "parent": "OpticalTesting",
       "child": "DynamicLightScattering"
     },
     {
-      "ID": "TR_6ba5a423",
+      "ID": "TR_25397b4c",
       "parent": "OpticalTesting",
       "child": "Ellipsometry"
     },
     {
-      "ID": "TR_2d1e83fa",
+      "ID": "TR_3d1aa631",
       "parent": "OpticalTesting",
       "child": "Fractography"
     },
     {
-      "ID": "TR_74dc0fe3",
+      "ID": "TR_95564040",
       "parent": "OpticalTesting",
       "child": "LightScattering"
     },
     {
-      "ID": "TR_10011ae8",
+      "ID": "TR_2227c8fc",
       "parent": "Impedimetry",
       "child": "ElectrochemicalImpedanceSpectroscopy"
     },
     {
-      "ID": "TR_f7c86715",
+      "ID": "TR_cad5cf70",
       "parent": "Electrogravimetry",
       "child": "ElectrochemicalPiezoelectricMicrogravimetry"
     },
     {
-      "ID": "TR_ef3654f7",
+      "ID": "TR_3d599745",
       "parent": "ChargeDistribution",
       "child": "ElectrochemicalTesting"
     },
     {
-      "ID": "TR_eba43b65",
+      "ID": "TR_066930fd",
       "parent": "ChargeDistribution",
       "child": "PulsedElectroacousticMethod"
     },
     {
-      "ID": "TR_0e40d503",
+      "ID": "TR_f12b8cbf",
       "parent": "ScanningElectronMicroscopy",
       "child": "ElectronBackscatterDiffraction"
     },
     {
-      "ID": "TR_61798a57",
+      "ID": "TR_c28100af",
       "parent": "ScatteringAndDiffraction",
       "child": "ElectronBackscatterDiffraction"
     },
     {
-      "ID": "TR_4f706d1d",
+      "ID": "TR_3312f06e",
       "parent": "ScanningElectronMicroscopy",
       "child": "ElectronBackscatterDiffraction"
     },
     {
-      "ID": "TR_a1cbb857",
+      "ID": "TR_0479d967",
       "parent": "ScatteringAndDiffraction",
       "child": "ElectronBackscatterDiffraction"
     },
     {
-      "ID": "TR_b81bcbe8",
+      "ID": "TR_247284dc",
       "parent": "ScatteringAndDiffraction",
       "child": "Synchrotron"
     },
     {
-      "ID": "TR_d3c255fd",
+      "ID": "TR_0fd04c32",
       "parent": "ScatteringAndDiffraction",
       "child": "XrayDiffraction"
     },
     {
-      "ID": "TR_03b2bc41",
+      "ID": "TR_f4256622",
       "parent": "ScatteringAndDiffraction",
       "child": "XrdGrazingIncidence"
     },
     {
-      "ID": "TR_436c071f",
+      "ID": "TR_654773b3",
       "parent": "Osmometry",
       "child": "FreezingPointDepressionOsmometry"
     },
     {
-      "ID": "TR_24cff1cc",
+      "ID": "TR_3e86df8b",
       "parent": "Osmometry",
       "child": "MembraneOsmometry"
     },
     {
-      "ID": "TR_6ca599ea",
+      "ID": "TR_9ac21417",
       "parent": "Osmometry",
       "child": "VaporPressureDepressionOsmometry"
     },
     {
-      "ID": "TR_b689e7c4",
+      "ID": "TR_ab1bf46b",
       "parent": "Porosimetry",
       "child": "GasAdsorptionPorosimetry"
     },
     {
-      "ID": "TR_c1ae4bdd",
+      "ID": "TR_4e33dc76",
       "parent": "Porosimetry",
       "child": "MercuryPorosimetry"
     },
     {
-      "ID": "TR_b41fc846",
+      "ID": "TR_7c3e918b",
       "parent": "SamplePreparation",
       "child": "Grinding"
     },
     {
-      "ID": "TR_6df2bec7",
+      "ID": "TR_84f5898a",
       "parent": "SamplePreparation",
       "child": "Milling"
     },
     {
-      "ID": "TR_b57170a1",
+      "ID": "TR_2b3cae87",
       "parent": "SamplePreparation",
       "child": "Mounting"
     },
     {
-      "ID": "TR_7bb9bb64",
+      "ID": "TR_883cdb5d",
       "parent": "SamplePreparation",
       "child": "Polishing"
     },
     {
-      "ID": "TR_a4b9728d",
+      "ID": "TR_d07c8ea3",
       "parent": "SamplePreparation",
       "child": "SamplePreparationByCutting"
     },
     {
-      "ID": "TR_b9b3c908",
+      "ID": "TR_d10df610",
       "parent": "CharacterisationProcedure",
       "child": "MeasurementSystemAdjustment"
     },
     {
-      "ID": "TR_21caff8c",
+      "ID": "TR_a9f4bdd7",
       "parent": "SamplePreparation",
       "child": "Mounting"
     },
     {
-      "ID": "TR_5b9b7c3e",
+      "ID": "TR_340d7bdc",
       "parent": "DataFiltering",
       "child": "OutlierRemoval"
     },
     {
-      "ID": "TR_f033860c",
+      "ID": "TR_a0252eec",
       "parent": "CharacterisationProcedure",
       "child": "SampleExtraction"
     },
     {
-      "ID": "TR_20849f74",
+      "ID": "TR_729e073b",
       "parent": "CharacterisationProcedure",
       "child": "SampleExtraction"
     },
     {
-      "ID": "TR_9699b856",
+      "ID": "TR_57ad82d2",
       "parent": "SampleExtraction",
       "child": "SampleExtractionByCutting"
     },
     {
-      "ID": "TR_bbe916d8",
+      "ID": "TR_2b378e8a",
       "parent": "SamplePreparation",
       "child": "SamplePreparationByCutting"
     },
     {
-      "ID": "TR_7598adfd",
+      "ID": "TR_b2f2ae39",
       "parent": "SampleExtraction",
       "child": "SampleExtractionByCutting"
     },
     {
-      "ID": "TR_fc002f03",
+      "ID": "TR_87908251",
       "parent": "CharacterisationProcedure",
       "child": "SampleInspection"
     },
     {
-      "ID": "TR_48433169",
+      "ID": "TR_454de156",
       "parent": "CharacterisationProcedure",
       "child": "SampleInspection"
     },
     {
-      "ID": "TR_b245e9c5",
+      "ID": "TR_e69c5c55",
       "parent": "CharacterisationProcedure",
       "child": "SampleInspection"
     },
     {
-      "ID": "TR_f194dc05",
+      "ID": "TR_c52815d1",
       "parent": "CharacterisationProcedure",
       "child": "SampleInspection"
     },
     {
-      "ID": "TR_5191e446",
+      "ID": "TR_b1664536",
       "parent": "CharacterisationProcedure",
       "child": "SamplePreparation"
     },
     {
-      "ID": "TR_bae3b6be",
+      "ID": "TR_6de70ab8",
       "parent": "CharacterisationProcedure",
       "child": "SamplePreparation"
     },
     {
-      "ID": "TR_66330d33",
+      "ID": "TR_6a334393",
       "parent": "CharacterisationProcedure",
       "child": "SamplePreparation"
     },
     {
-      "ID": "TR_98b4365a",
+      "ID": "TR_0e1769d9",
       "parent": "CharacterisationProcedure",
       "child": "SamplePreparation"
     },
     {
-      "ID": "TR_5af82b0b",
+      "ID": "TR_6960dc6e",
       "parent": "DCPolarography",
       "child": "SampledDCPolarography"
     },
     {
-      "ID": "TR_4ce40260",
+      "ID": "TR_73097a5e",
       "parent": "HydrodynamicVoltammetry",
       "child": "VoltammetryAtARotatingDiskElectrode"
     },
     {
-      "ID": "TR_d7fb10f2",
+      "ID": "TR_7052e819",
       "parent": "XrayDiffraction",
       "child": "XrayPowderDiffraction"
     }

bmo/term_typings.json

@@ -1,86 +1,86 @@
 [
   {
-    "ID": "TT_3fd4df50",
-    "term": "Masonry",
+    "ID": "TT_29b36852",
+    "term": "Copper",
     "types": [
-      "CompositeMaterial"
+      "MetallicMaterial"
     ]
   },
   {
-    "ID": "TT_f4ddd84a",
-    "term": "Concrete",
+    "ID": "TT_bef9e0bc",
+    "term": "Aluminium",
     "types": [
-      "CompositeMaterial"
+      "MetallicMaterial"
     ]
   },
   {
-    "ID": "TT_bb981e57",
-    "term": "Wood",
+    "ID": "TT_a22f30a7",
+    "term": "Steel",
     "types": [
-      "InorganicNonMetallicMaterial"
+      "MetallicMaterial"
     ]
   },
   {
-    "ID": "TT_5a9621e2",
-    "term": "Polymer",
+    "ID": "TT_7ec96385",
+    "term": "CastIron",
     "types": [
-      "InorganicNonMetallicMaterial"
+      "MetallicMaterial"
     ]
   },
   {
-    "ID": "TT_5c2008e4",
-    "term": "Bitumen",
+    "ID": "TT_6640dae4",
+    "term": "Polymer",
     "types": [
       "InorganicNonMetallicMaterial"
     ]
   },
   {
-    "ID": "TT_bb3af282",
-    "term": "CementStone",
+    "ID": "TT_33900f27",
+    "term": "Bitumen",
     "types": [
-      "OrganicaMaterial"
+      "InorganicNonMetallicMaterial"
     ]
   },
   {
-    "ID": "TT_5b59a756",
-    "term": "Glass",
+    "ID": "TT_95b211f8",
+    "term": "Wood",
     "types": [
-      "OrganicaMaterial"
+      "InorganicNonMetallicMaterial"
     ]
   },
   {
-    "ID": "TT_43f093d4",
-    "term": "Ceramic",
+    "ID": "TT_55fc0cf2",
+    "term": "Masonry",
     "types": [
-      "OrganicaMaterial"
+      "CompositeMaterial"
     ]
   },
   {
-    "ID": "TT_5eccd74e",
-    "term": "Copper",
+    "ID": "TT_fd2c5742",
+    "term": "Concrete",
     "types": [
-      "MetallicMaterial"
+      "CompositeMaterial"
     ]
   },
   {
-    "ID": "TT_1cb37adf",
-    "term": "CastIron",
+    "ID": "TT_a8a93a73",
+    "term": "CementStone",
     "types": [
-      "MetallicMaterial"
+      "OrganicaMaterial"
     ]
   },
   {
-    "ID": "TT_a8e840f7",
-    "term": "Aluminium",
+    "ID": "TT_8336ab08",
+    "term": "Ceramic",
     "types": [
-      "MetallicMaterial"
+      "OrganicaMaterial"
     ]
   },
   {
-    "ID": "TT_5ddad5f6",
-    "term": "Steel",
+    "ID": "TT_ea3df19b",
+    "term": "Glass",
     "types": [
-      "MetallicMaterial"
+      "OrganicaMaterial"
     ]
   }
 ]

bmo/type_taxonomies.json

@@ -1,127 +1,127 @@
 {
   "types": [
-    "ConstituentSet",
-    "MaterialProperty",
-    "MaterialOpticalProperty",
-    "MaterialDefinition",
-    "Layer",
-    "MaterialType",
+    "CompositeMaterial",
+    "MaterialHygroscopicProperty",
+    "Constituent",
+    "MaterialFuelProperty",
+    "MaterialCombustionProperty",
     "ProfileSet",
-    "MaterialPhysicalProperty",
+    "InorganicNonMetallicMaterial",
     "LayerSet",
-    "MaterialCombustionProperty",
+    "MaterialType",
+    "Property",
     "MaterialEnergyProperty",
-    "Profile",
+    "ConstituentSet",
+    "MaterialDefinition",
+    "MaterialThermalProperty",
     "MetallicMaterial",
+    "Profile",
+    "MaterialProperty",
     "OrganicaMaterial",
+    "MaterialPhysicalProperty",
+    "MaterialOpticalProperty",
     "MaterialMechanicalProperty",
-    "Property",
-    "InorganicNonMetallicMaterial",
-    "MaterialFuelProperty",
-    "CompositeMaterial",
-    "Constituent",
     "MaterialChemicalProperty",
-    "MaterialThermalProperty",
-    "MaterialHygroscopicProperty"
+    "Layer"
   ],
   "taxonomies": [
     {
-      "ID": "TR_5d56039f",
+      "ID": "TR_dab4e27f",
       "parent": "MaterialType",
       "child": "CompositeMaterial"
     },
     {
-      "ID": "TR_2247ec81",
+      "ID": "TR_22c593e5",
       "parent": "MaterialType",
       "child": "InorganicNonMetallicMaterial"
     },
     {
-      "ID": "TR_51ea3411",
+      "ID": "TR_99fa808c",
       "parent": "MaterialType",
       "child": "MetallicMaterial"
     },
     {
-      "ID": "TR_f2f522a1",
+      "ID": "TR_0604b59d",
       "parent": "MaterialType",
       "child": "OrganicaMaterial"
     },
     {
-      "ID": "TR_73dd9ed8",
+      "ID": "TR_939cb6e9",
       "parent": "MaterialProperty",
       "child": "MaterialChemicalProperty"
     },
     {
-      "ID": "TR_3e132db0",
+      "ID": "TR_8ba88af1",
       "parent": "MaterialProperty",
       "child": "MaterialCombustionProperty"
     },
     {
-      "ID": "TR_3ef530e6",
+      "ID": "TR_21f23466",
       "parent": "MaterialProperty",
       "child": "MaterialEnergyProperty"
     },
     {
-      "ID": "TR_b23b490a",
+      "ID": "TR_e6fdbc2e",
       "parent": "MaterialProperty",
       "child": "MaterialFuelProperty"
     },
     {
-      "ID": "TR_60405c44",
+      "ID": "TR_e9cf83df",
       "parent": "MaterialProperty",
       "child": "MaterialHygroscopicProperty"
     },
     {
-      "ID": "TR_c82b544e",
+      "ID": "TR_b0b3e618",
       "parent": "MaterialProperty",
       "child": "MaterialMechanicalProperty"
     },
     {
-      "ID": "TR_f96bf4de",
+      "ID": "TR_073ab711",
       "parent": "MaterialProperty",
       "child": "MaterialOpticalProperty"
     },
     {
-      "ID": "TR_ec1e70d1",
+      "ID": "TR_3f2b2022",
       "parent": "MaterialProperty",
       "child": "MaterialPhysicalProperty"
     },
     {
-      "ID": "TR_3bb45d3c",
+      "ID": "TR_0bce5f19",
       "parent": "MaterialProperty",
       "child": "MaterialThermalProperty"
     },
     {
-      "ID": "TR_ad5a9b2e",
+      "ID": "TR_93371ee0",
       "parent": "Property",
       "child": "MaterialProperty"
     },
     {
-      "ID": "TR_0b9533b1",
+      "ID": "TR_72521d4a",
       "parent": "MaterialDefinition",
       "child": "Constituent"
     },
     {
-      "ID": "TR_983b8897",
+      "ID": "TR_73c34daa",
       "parent": "MaterialDefinition",
       "child": "ConstituentSet"
     },
     {
-      "ID": "TR_16e6bccd",
+      "ID": "TR_e4bb1685",
       "parent": "MaterialDefinition",
       "child": "Layer"
     },
     {
-      "ID": "TR_2ec89117",
+      "ID": "TR_b572f328",
       "parent": "MaterialDefinition",
       "child": "LayerSet"
     },
     {
-      "ID": "TR_badafc57",
+      "ID": "TR_fb4690db",
       "parent": "MaterialDefinition",
       "child": "Profile"
     },
     {
-      "ID": "TR_1400bfb9",
+      "ID": "TR_a01df66e",
       "parent": "MaterialDefinition",
       "child": "ProfileSet"
     }

cdco/type_taxonomies.json

@@ -1,30 +1,30 @@
 {
   "types": [
-    "Material",
-    "Crystalline Material",
-    "Planar Defect",
     "Crystallographic Defect",
+    "Planar Defect",
+    "Crystalline Material",
+    "Material",
     "Line Defect",
     "Point Defect"
   ],
   "taxonomies": [
     {
-      "ID": "TR_b926aa1f",
+      "ID": "TR_eb71ee6e",
       "parent": "Material",
       "child": "Crystalline Material"
     },
     {
-      "ID": "TR_d0a04b41",
+      "ID": "TR_ed125af2",
       "parent": "Crystallographic Defect",
       "child": "Line Defect"
     },
     {
-      "ID": "TR_16569cc1",
+      "ID": "TR_cbde1e42",
       "parent": "Crystallographic Defect",
       "child": "Planar Defect"
     },
     {
-      "ID": "TR_521b643a",
+      "ID": "TR_f0d881dd",
       "parent": "Crystallographic Defect",
       "child": "Point Defect"
     }

chameo/type_non_taxonomic_relations.json

@@ -10,13 +10,13 @@
   ],
   "non_taxonomies": [
     {
-      "ID": "NR_553018d1",
+      "ID": "NR_e4443958",
       "head": "PreparedSample",
       "tail": "ReferenceSample",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_9afbc802",
+      "ID": "NR_d5b611c3",
       "head": "HardwareManufacturer",
       "tail": "HardwareModel",
       "relation": "disjointWith"

chameo/type_taxonomies.json

@@ -1,1149 +1,1149 @@
 {
   "types": [
+    "ScanningTunnelingMicroscopy",
+    "HardwareModel",
+    "TensileTesting",
+    "DataFiltering",
+    "RawSample",
+    "XpsVariableKinetic",
+    "ThreePointBendingTesting",
+    "LightScattering",
+    "MechanicalTesting",
+    "Probe",
+    "ThermochemicalTesting",
+    "SamplePreparationByCutting",
+    "XrdGrazingIncidence",
+    "OpticalMicroscopy",
+    "Voltammetry",
+    "MeasurementSystemAdjustment",
+    "OutlierRemoval",
+    "Spectroscopy",
+    "CriticalAndSupercriticalChromatography",
+    "DynamicLightScattering",
+    "Electrogravimetry",
+    "DynamicMechanicalSpectroscopy",
+    "AtomicForceMicroscopy",
+    "AtomProbeTomography",
+    "SampleInspectionInstrument",
+    "HydrodynamicVoltammetry",
+    "SecondaryData",
+    "Fractography",
+    "Nanoindentation",
+    "FibDic",
+    "BrunauerEmmettTellerMethod",
+    "Calorimetry",
+    "IntermediateSample",
+    "HardnessTesting",
+    "WearTesting",
     "EnergyDispersiveXraySpectroscopy",
-    "SampleExtractionInstrument",
-    "LinearScanVoltammetry",
-    "CyclicChronopotentiometry",
-    "DeviceSample",
+    "Conductometry",
+    "DirectCoulometryAtControlledPotential",
+    "MercuryPorosimetry",
+    "CyclicVoltammetry",
+    "DifferentialRefractiveIndex",
+    "IsothermalMicrocalorimetry",
+    "AnodicStrippingVoltammetry",
+    "Ellipsometry",
+    "PseudoOpenCircuitVoltageMethod",
+    "CharacterisationData",
+    "Porosimetry",
+    "ACVoltammetry",
+    "Grinding",
+    "LinearChronopotentiometry",
     "ElectrochemicalTesting",
+    "PreparedSample",
+    "SampleInspection",
+    "CharacterisationProtocol",
+    "StepChronopotentiometry",
+    "CathodicStrippingVoltammetry",
+    "CyclicChronopotentiometry",
+    "CharacterisedSample",
+    "ShearOrTorsionTesting",
+    "ElectronBackscatterDiffraction",
+    "GammaSpectrometry",
+    "SamplePreparationInstrument",
+    "DirectCoulometryAtControlledCurrent",
+    "ConductometricTitration",
     "UltrasonicTesting",
-    "HPPC",
+    "FatigueTesting",
+    "Mounting",
+    "ConfocalMicroscopy",
+    "Dilatometry",
+    "SampleExtraction",
+    "DifferentialScanningCalorimetry",
+    "CharacterisationProcedure",
+    "Chronopotentiometry",
+    "DifferentialLinearPulseVoltammetry",
     "Signal",
-    "DataNormalisation",
+    "DirectCurrentInternalResistance",
+    "EnvironmentalScanningElectronMicroscopy",
+    "LinearScanVoltammetry",
+    "OpenCircuitHold",
+    "IonMobilitySpectrometry",
+    "AbrasiveStrippingVoltammetry",
+    "NormalPulseVoltammetry",
+    "Viscometry",
+    "CoulometricTitration",
     "ICI",
-    "ACVoltammetry",
-    "FourierTransformInfraredSpectroscopy",
-    "SampledDCPolarography",
-    "ScanningProbeMicroscopy",
-    "SampleExtraction",
-    "WearTesting",
-    "ChargeDistribution",
+    "PrimaryData",
+    "PulsedElectroacousticMethod",
+    "Polishing",
+    "ScanningElectronMicroscopy",
+    "ElectrochemicalImpedanceSpectroscopy",
+    "AlphaSpectrometry",
+    "PhotoluminescenceMicroscopy",
+    "Osmometry",
+    "Tomography",
     "Exafs",
-    "DifferentialScanningCalorimetry",
-    "Chronocoulometry",
+    "SecondaryIonMassSpectrometry",
     "Thermogravimetry",
-    "LinearChronopotentiometry",
-    "ThermochemicalTesting",
-    "AdsorptiveStrippingVoltammetry",
-    "SamplePreparationInstrument",
-    "StepChronopotentiometry",
-    "RawData",
-    "CharacterisationProcedure",
-    "GasAdsorptionPorosimetry",
+    "SampleExtractionByCutting",
+    "DielectricAndImpedanceSpectroscopy",
+    "Coulometry",
+    "Amperometry",
+    "ScanningProbeMicroscopy",
+    "Chronocoulometry",
+    "CreepTesting",
+    "Holder",
+    "DynamicMechanicalAnalysis",
+    "HardwareManufacturer",
     "SquareWaveVoltammetry",
-    "Synchrotron",
-    "VaporPressureDepressionOsmometry",
-    "CathodicStrippingVoltammetry",
+    "AnalyticalElectronMicroscopy",
+    "MembraneOsmometry",
+    "XrayDiffraction",
+    "ChargeDistribution",
+    "SamplePreparation",
+    "DeviceSample",
     "FreezingPointDepressionOsmometry",
-    "BrunauerEmmettTellerMethod",
-    "DataPreparation",
-    "Conductometry",
-    "Osmometry",
-    "CriticalAndSupercriticalChromatography",
-    "AnodicStrippingVoltammetry",
-    "CyclicVoltammetry",
-    "Spectroscopy",
-    "Impedimetry",
-    "CompressionTesting",
-    "DynamicLightScattering",
-    "IntermediateSample",
+    "Chromatography",
+    "ScanningKelvinProbe",
     "DifferentialStaircasePulseVoltammetry",
-    "RamanSpectroscopy",
-    "Viscometry",
-    "PseudoOpenCircuitVoltageMethod",
-    "Nanoindentation",
-    "SecondaryIonMassSpectrometry",
-    "DielectricAndImpedanceSpectroscopy",
-    "SecondaryData",
-    "OutlierRemoval",
-    "CharacterisationHardware",
-    "Ellipsometry",
-    "OpticalTesting",
-    "MechanicalTesting",
-    "StrippingVoltammetry",
-    "PhotoluminescenceMicroscopy",
-    "CalibrationData",
-    "SampleInspection",
-    "Chronoamperometry",
+    "IonChromatography",
+    "Nexafs",
     "CharacterisationMeasurementProcess",
+    "NeutronSpinEchoSpectroscopy",
+    "CharacterisationHardware",
+    "MassSpectrometry",
+    "ElectronProbeMicroanalysis",
     "CharacterisationHardwareSpecification",
-    "MembraneOsmometry",
-    "Polishing",
-    "Holder",
+    "FourierTransformInfraredSpectroscopy",
+    "UltravioletVisibleSpectroscopy",
     "XrayPowderDiffraction",
-    "Microscopy",
-    "ElectrochemicalPiezoelectricMicrogravimetry",
-    "PulsedElectroacousticMethod",
-    "Chromatography",
-    "HardwareModel",
-    "Sample",
-    "ElectronBackscatterDiffraction",
-    "DirectCoulometryAtControlledPotential",
-    "ScanningKelvinProbe",
-    "GalvanostaticIntermittentTitrationTechnique",
-    "Spectrometry",
-    "IsothermalMicrocalorimetry",
-    "AlphaSpectrometry",
-    "PrimaryData",
-    "ElectrochemicalImpedanceSpectroscopy",
-    "ConfocalMicroscopy",
-    "SamplePreparation",
-    "Chronopotentiometry",
-    "ShearOrTorsionTesting",
-    "ScanningTunnelingMicroscopy",
-    "OpenCircuitHold",
     "DCPolarography",
-    "DirectCurrentInternalResistance",
-    "IonMobilitySpectrometry",
-    "ElectronProbeMicroanalysis",
-    "MassSpectrometry",
     "CharacterisationTechnique",
-    "Coulometry",
-    "DynamicMechanicalSpectroscopy",
-    "HydrodynamicVoltammetry",
-    "Profilometry",
-    "DirectCoulometryAtControlledCurrent",
-    "Probe",
-    "MercuryPorosimetry",
-    "DifferentialLinearPulseVoltammetry",
-    "DataFiltering",
-    "DynamicMechanicalAnalysis",
-    "Potentiometry",
-    "MeasurementSystemAdjustment",
-    "DifferentialPulseVoltammetry",
-    "XrayDiffraction",
-    "Voltammetry",
+    "Dielectrometry",
     "TransmissionElectronMicroscopy",
-    "CharacterisationProtocol",
-    "EnvironmentalScanningElectronMicroscopy",
-    "CharacterisedSample",
-    "FieldEmissionScanningElectronMicroscopy",
+    "ReferenceSample",
+    "VoltammetryAtARotatingDiskElectrode",
+    "CalibrationProcess",
+    "ScanningAugerElectronMicroscopy",
+    "Detector",
     "CharacterisationMeasurementInstrument",
-    "HardnessTesting",
-    "ThreePointBendingTesting",
-    "AbrasiveStrippingVoltammetry",
-    "Dilatometry",
-    "Fractography",
+    "SampleExtractionInstrument",
+    "CompressionTesting",
+    "OpticalTesting",
+    "Synchrotron",
+    "NuclearMagneticResonance",
+    "VaporPressureDepressionOsmometry",
+    "FieldEmissionScanningElectronMicroscopy",
+    "CalibrationData",
+    "RamanSpectroscopy",
+    "Sample",
+    "AdsorptiveStrippingVoltammetry",
+    "Microscopy",
+    "HPPC",
+    "GasAdsorptionPorosimetry",
+    "Impedimetry",
+    "Spectrometry",
     "DifferentialThermalAnalysis",
-    "XrdGrazingIncidence",
-    "CharacterisationData",
-    "ScanningAugerElectronMicroscopy",
-    "FatigueTesting",
-    "PotentiometricStrippingAnalysis",
-    "AtomicForceMicroscopy",
-    "XpsVariableKinetic",
-    "Calorimetry",
-    "CreepTesting",
-    "LightScattering",
-    "SampleInspectionInstrument",
-    "DifferentialRefractiveIndex",
-    "Electrogravimetry",
-    "SamplePreparationByCutting",
-    "Dielectrometry",
-    "TensileTesting",
-    "UltravioletVisibleSpectroscopy",
-    "NormalPulseVoltammetry",
-    "RawSample",
-    "Nexafs",
-    "VoltammetryAtARotatingDiskElectrode",
-    "Amperometry",
-    "OpticalMicroscopy",
-    "Grinding",
-    "HardwareManufacturer",
-    "FibDic",
+    "StrippingVoltammetry",
+    "DataNormalisation",
+    "DataPreparation",
+    "Potentiometry",
+    "Profilometry",
+    "RawData",
+    "SampledDCPolarography",
+    "DifferentialPulseVoltammetry",
+    "Chronoamperometry",
     "Milling",
-    "NuclearMagneticResonance",
-    "ScanningElectronMicroscopy",
-    "CoulometricTitration",
-    "ConductometricTitration",
-    "ReferenceSample",
-    "AtomProbeTomography",
-    "Porosimetry",
+    "GalvanostaticIntermittentTitrationTechnique",
+    "PotentiometricStrippingAnalysis",
     "ScatteringAndDiffraction",
-    "CalibrationProcess",
-    "NeutronSpinEchoSpectroscopy",
-    "Mounting",
-    "SampleExtractionByCutting",
-    "Detector",
-    "GammaSpectrometry",
-    "AnalyticalElectronMicroscopy",
-    "Tomography",
-    "PreparedSample",
-    "IonChromatography"
+    "ElectrochemicalPiezoelectricMicrogravimetry"
   ],
   "taxonomies": [
     {
-      "ID": "TR_00e03c28",
+      "ID": "TR_cc97a976",
       "parent": "Voltammetry",
       "child": "ACVoltammetry"
     },
     {
-      "ID": "TR_a46923d1",
+      "ID": "TR_2c2671b5",
       "parent": "Voltammetry",
       "child": "AbrasiveStrippingVoltammetry"
     },
     {
-      "ID": "TR_e32a2e1e",
+      "ID": "TR_0ec2115c",
       "parent": "Voltammetry",
       "child": "CyclicVoltammetry"
     },
     {
-      "ID": "TR_557a7a9d",
+      "ID": "TR_12630ac4",
       "parent": "Voltammetry",
       "child": "DCPolarography"
     },
     {
-      "ID": "TR_063acbb4",
+      "ID": "TR_d7f30473",
       "parent": "Voltammetry",
       "child": "DifferentialPulseVoltammetry"
     },
     {
-      "ID": "TR_be06b3b3",
+      "ID": "TR_e9f9ba16",
       "parent": "Voltammetry",
       "child": "HydrodynamicVoltammetry"
     },
     {
-      "ID": "TR_eec6dc3b",
+      "ID": "TR_5cd95ea1",
       "parent": "Voltammetry",
       "child": "LinearScanVoltammetry"
     },
     {
-      "ID": "TR_9cdac9c2",
+      "ID": "TR_80a7fb4e",
       "parent": "Voltammetry",
       "child": "NormalPulseVoltammetry"
     },
     {
-      "ID": "TR_300b4d8a",
+      "ID": "TR_77171839",
       "parent": "Voltammetry",
       "child": "PotentiometricStrippingAnalysis"
     },
     {
-      "ID": "TR_1e4ae58f",
+      "ID": "TR_a8818568",
       "parent": "Voltammetry",
       "child": "SquareWaveVoltammetry"
     },
     {
-      "ID": "TR_9392191e",
+      "ID": "TR_df7ae928",
       "parent": "Voltammetry",
       "child": "StrippingVoltammetry"
     },
     {
-      "ID": "TR_b3bf4e0e",
+      "ID": "TR_ccf4a42d",
       "parent": "StrippingVoltammetry",
       "child": "AdsorptiveStrippingVoltammetry"
     },
     {
-      "ID": "TR_1ae8f77d",
+      "ID": "TR_a00e0783",
       "parent": "StrippingVoltammetry",
       "child": "AnodicStrippingVoltammetry"
     },
     {
-      "ID": "TR_112b6803",
+      "ID": "TR_87b276f3",
       "parent": "StrippingVoltammetry",
       "child": "CathodicStrippingVoltammetry"
     },
     {
-      "ID": "TR_6d93d6f5",
+      "ID": "TR_c6ab8f87",
       "parent": "Spectrometry",
       "child": "AlphaSpectrometry"
     },
     {
-      "ID": "TR_8279f427",
+      "ID": "TR_eb3f4cfa",
       "parent": "Spectrometry",
       "child": "GammaSpectrometry"
     },
     {
-      "ID": "TR_c9111a83",
+      "ID": "TR_aa38ffda",
       "parent": "Spectrometry",
       "child": "IonMobilitySpectrometry"
     },
     {
-      "ID": "TR_26d01384",
+      "ID": "TR_5043771c",
       "parent": "Spectrometry",
       "child": "MassSpectrometry"
     },
     {
-      "ID": "TR_ddda38fd",
+      "ID": "TR_acb545f9",
       "parent": "Spectrometry",
       "child": "SecondaryIonMassSpectrometry"
     },
     {
-      "ID": "TR_46cf0e23",
+      "ID": "TR_b073014d",
       "parent": "ElectrochemicalTesting",
       "child": "Amperometry"
     },
     {
-      "ID": "TR_293a700f",
+      "ID": "TR_e8fc41af",
       "parent": "ElectrochemicalTesting",
       "child": "Conductometry"
     },
     {
-      "ID": "TR_e8abc9e5",
+      "ID": "TR_a517ec22",
       "parent": "ElectrochemicalTesting",
       "child": "Coulometry"
     },
     {
-      "ID": "TR_59241779",
+      "ID": "TR_8d40cc74",
       "parent": "ElectrochemicalTesting",
       "child": "Dielectrometry"
     },
     {
-      "ID": "TR_4f0f8547",
+      "ID": "TR_ee1cb9ee",
       "parent": "ElectrochemicalTesting",
       "child": "Electrogravimetry"
     },
     {
-      "ID": "TR_2928308d",
+      "ID": "TR_3aade003",
       "parent": "ElectrochemicalTesting",
       "child": "Impedimetry"
     },
     {
-      "ID": "TR_b276f714",
+      "ID": "TR_b581cc52",
       "parent": "ElectrochemicalTesting",
       "child": "Potentiometry"
     },
     {
-      "ID": "TR_ca0c8070",
+      "ID": "TR_878422d5",
       "parent": "ElectrochemicalTesting",
       "child": "Voltammetry"
     },
     {
-      "ID": "TR_dedeb6b1",
+      "ID": "TR_bc348e77",
       "parent": "Microscopy",
       "child": "AnalyticalElectronMicroscopy"
     },
     {
-      "ID": "TR_d3002aae",
+      "ID": "TR_32f8ec54",
       "parent": "Microscopy",
       "child": "AtomicForceMicroscopy"
     },
     {
-      "ID": "TR_fc37c773",
+      "ID": "TR_80a6a29a",
       "parent": "Microscopy",
       "child": "ConfocalMicroscopy"
     },
     {
-      "ID": "TR_4d9ccb2a",
+      "ID": "TR_5e6c646f",
       "parent": "Microscopy",
       "child": "ElectronProbeMicroanalysis"
     },
     {
-      "ID": "TR_1d3b10f2",
+      "ID": "TR_5ce6d79d",
       "parent": "Microscopy",
       "child": "EnvironmentalScanningElectronMicroscopy"
     },
     {
-      "ID": "TR_3f230aa6",
+      "ID": "TR_626655f3",
       "parent": "Microscopy",
       "child": "FieldEmissionScanningElectronMicroscopy"
     },
     {
-      "ID": "TR_dc386e81",
+      "ID": "TR_f31746fa",
       "parent": "Microscopy",
       "child": "OpticalMicroscopy"
     },
     {
-      "ID": "TR_c2e752aa",
+      "ID": "TR_162aa6aa",
       "parent": "Microscopy",
       "child": "PhotoluminescenceMicroscopy"
     },
     {
-      "ID": "TR_ca356f19",
+      "ID": "TR_0ae8e333",
       "parent": "Microscopy",
       "child": "ScanningAugerElectronMicroscopy"
     },
     {
-      "ID": "TR_1e55cae6",
+      "ID": "TR_44a05726",
       "parent": "Microscopy",
       "child": "ScanningElectronMicroscopy"
     },
     {
-      "ID": "TR_c2012fd6",
+      "ID": "TR_9f6fc544",
       "parent": "Microscopy",
       "child": "ScanningKelvinProbe"
     },
     {
-      "ID": "TR_624c207a",
+      "ID": "TR_64c71ae4",
       "parent": "Microscopy",
       "child": "ScanningProbeMicroscopy"
     },
     {
-      "ID": "TR_0e243c51",
+      "ID": "TR_30ba0f20",
       "parent": "Microscopy",
       "child": "ScanningTunnelingMicroscopy"
     },
     {
-      "ID": "TR_914f19f7",
+      "ID": "TR_855fa624",
       "parent": "Microscopy",
       "child": "TransmissionElectronMicroscopy"
     },
     {
-      "ID": "TR_2171341a",
+      "ID": "TR_cccd2dfe",
       "parent": "Tomography",
       "child": "AtomProbeTomography"
     },
     {
-      "ID": "TR_9ae9ce67",
+      "ID": "TR_48a2250d",
       "parent": "GasAdsorptionPorosimetry",
       "child": "BrunauerEmmettTellerMethod"
     },
     {
-      "ID": "TR_25c536d9",
+      "ID": "TR_73b03870",
       "parent": "CharacterisationData",
       "child": "CalibrationData"
     },
     {
-      "ID": "TR_f386746e",
+      "ID": "TR_993ddb8c",
       "parent": "CharacterisationData",
       "child": "PrimaryData"
     },
     {
-      "ID": "TR_83993af9",
+      "ID": "TR_961ad70d",
       "parent": "CharacterisationData",
       "child": "RawData"
     },
     {
-      "ID": "TR_35dbcc09",
+      "ID": "TR_d879287c",
       "parent": "CharacterisationData",
       "child": "SecondaryData"
     },
     {
-      "ID": "TR_b36bf8d8",
+      "ID": "TR_f81decf6",
       "parent": "CharacterisationData",
       "child": "Signal"
     },
     {
-      "ID": "TR_7818fe2d",
+      "ID": "TR_7da9e7b1",
       "parent": "CharacterisationProcedure",
       "child": "CalibrationProcess"
     },
     {
-      "ID": "TR_8d8095b8",
+      "ID": "TR_e9212768",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_925ca709",
+      "ID": "TR_90d591b8",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationProtocol"
     },
     {
-      "ID": "TR_741cec42",
+      "ID": "TR_07c4a0f0",
       "parent": "CharacterisationProcedure",
       "child": "MeasurementSystemAdjustment"
     },
     {
-      "ID": "TR_2cee9c58",
+      "ID": "TR_a3f4e32b",
       "parent": "CharacterisationProcedure",
       "child": "SampleExtraction"
     },
     {
-      "ID": "TR_1a84eb46",
+      "ID": "TR_eb5a03cd",
       "parent": "CharacterisationProcedure",
       "child": "SampleInspection"
     },
     {
-      "ID": "TR_8ca53edb",
+      "ID": "TR_64da4527",
       "parent": "CharacterisationProcedure",
       "child": "SamplePreparation"
     },
     {
-      "ID": "TR_01de90d6",
+      "ID": "TR_745ee430",
       "parent": "CharacterisationProcedure",
       "child": "CalibrationProcess"
     },
     {
-      "ID": "TR_fc2565e4",
+      "ID": "TR_05c8378a",
       "parent": "CharacterisationProcedure",
       "child": "CalibrationProcess"
     },
     {
-      "ID": "TR_3eea49bd",
+      "ID": "TR_ce18a0a8",
       "parent": "CharacterisationProcedure",
       "child": "CalibrationProcess"
     },
     {
-      "ID": "TR_a976649c",
+      "ID": "TR_4656ba61",
       "parent": "CharacterisationProcedure",
       "child": "CalibrationProcess"
     },
     {
-      "ID": "TR_72f0643e",
+      "ID": "TR_ca506155",
       "parent": "ThermochemicalTesting",
       "child": "Calorimetry"
     },
     {
-      "ID": "TR_1666edea",
+      "ID": "TR_3aaa917e",
       "parent": "ThermochemicalTesting",
       "child": "DifferentialScanningCalorimetry"
     },
     {
-      "ID": "TR_64acefbe",
+      "ID": "TR_4c92eb36",
       "parent": "ThermochemicalTesting",
       "child": "DifferentialThermalAnalysis"
     },
     {
-      "ID": "TR_b7e2341c",
+      "ID": "TR_1b015347",
       "parent": "ThermochemicalTesting",
       "child": "IsothermalMicrocalorimetry"
     },
     {
-      "ID": "TR_4918b825",
+      "ID": "TR_69d0441a",
       "parent": "ThermochemicalTesting",
       "child": "Thermogravimetry"
     },
     {
-      "ID": "TR_2cc41b7f",
+      "ID": "TR_e7424e39",
       "parent": "Sample",
       "child": "DeviceSample"
     },
     {
-      "ID": "TR_e5de6416",
+      "ID": "TR_15134ac2",
       "parent": "CharacterisationHardwareSpecification",
       "child": "HardwareManufacturer"
     },
     {
-      "ID": "TR_ec18f721",
+      "ID": "TR_2fab5a6b",
       "parent": "CharacterisationHardwareSpecification",
       "child": "HardwareModel"
     },
     {
-      "ID": "TR_66de5fdf",
+      "ID": "TR_fa5abaab",
       "parent": "CharacterisationHardware",
       "child": "CharacterisationMeasurementInstrument"
     },
     {
-      "ID": "TR_22afd84d",
+      "ID": "TR_09cdc417",
       "parent": "CharacterisationHardware",
       "child": "CharacterisationMeasurementInstrument"
     },
     {
-      "ID": "TR_cee15698",
+      "ID": "TR_ea6e4d33",
       "parent": "CharacterisationHardware",
       "child": "Detector"
     },
     {
-      "ID": "TR_5c322126",
+      "ID": "TR_4d3ed3b9",
       "parent": "CharacterisationHardware",
       "child": "Holder"
     },
     {
-      "ID": "TR_7fa90e30",
+      "ID": "TR_47a80e7c",
       "parent": "CharacterisationHardware",
       "child": "Probe"
     },
     {
-      "ID": "TR_04b85983",
+      "ID": "TR_06e20ff5",
       "parent": "CharacterisationHardware",
       "child": "SampleExtractionInstrument"
     },
     {
-      "ID": "TR_9f7ebd87",
+      "ID": "TR_0a9b86f1",
       "parent": "CharacterisationHardware",
       "child": "SampleInspectionInstrument"
     },
     {
-      "ID": "TR_61fb6949",
+      "ID": "TR_2daf87a6",
       "parent": "CharacterisationHardware",
       "child": "SamplePreparationInstrument"
     },
     {
-      "ID": "TR_7495ffa9",
+      "ID": "TR_52bf74b2",
       "parent": "CharacterisationHardware",
       "child": "CharacterisationMeasurementInstrument"
     },
     {
-      "ID": "TR_d0eea0a7",
+      "ID": "TR_b40fdeed",
       "parent": "CharacterisationHardware",
       "child": "CharacterisationMeasurementInstrument"
     },
     {
-      "ID": "TR_f225674a",
+      "ID": "TR_3503aba6",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_a4dcb838",
+      "ID": "TR_41d1a864",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_65173475",
+      "ID": "TR_ad03998c",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_a448fc8e",
+      "ID": "TR_51a8a672",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_bda4882e",
+      "ID": "TR_61990497",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_a707985d",
+      "ID": "TR_20c808d8",
       "parent": "CharacterisationProcedure",
       "child": "CharacterisationMeasurementProcess"
     },
     {
-      "ID": "TR_6f5c5ab8",
+      "ID": "TR_c8a93d0d",
       "parent": "Sample",
       "child": "CharacterisedSample"
     },
     {
-      "ID": "TR_d580b5c9",
+      "ID": "TR_f2fbf791",
       "parent": "Sample",
       "child": "DeviceSample"
     },
     {
-      "ID": "TR_e5db2b30",
+      "ID": "TR_132b9b61",
       "parent": "Sample",
       "child": "IntermediateSample"
     },
     {
-      "ID": "TR_dea5423e",
+      "ID": "TR_0d457bb8",
       "parent": "Sample",
       "child": "PreparedSample"
     },
     {
-      "ID": "TR_d688e4df",
+      "ID": "TR_3ecb5a5f",
       "parent": "Sample",
       "child": "RawSample"
     },
     {
-      "ID": "TR_87ead287",
+      "ID": "TR_e852515f",
       "parent": "Sample",
       "child": "ReferenceSample"
     },
     {
-      "ID": "TR_7a76017d",
+      "ID": "TR_d078cad6",
       "parent": "CharacterisationTechnique",
       "child": "ChargeDistribution"
     },
     {
-      "ID": "TR_1e4073e1",
+      "ID": "TR_a6f348d0",
       "parent": "CharacterisationTechnique",
       "child": "Chromatography"
     },
     {
-      "ID": "TR_cdd9b2ed",
+      "ID": "TR_f9eb6e4c",
       "parent": "CharacterisationTechnique",
       "child": "Dilatometry"
     },
     {
-      "ID": "TR_9a3ef21d",
+      "ID": "TR_a3a2d2f6",
       "parent": "CharacterisationTechnique",
       "child": "MechanicalTesting"
     },
     {
-      "ID": "TR_ade80008",
+      "ID": "TR_7596de25",
       "parent": "CharacterisationTechnique",
       "child": "Microscopy"
     },
     {
-      "ID": "TR_c7420a8e",
+      "ID": "TR_92e674e2",
       "parent": "CharacterisationTechnique",
       "child": "OpticalTesting"
     },
     {
-      "ID": "TR_d6f2c2c8",
+      "ID": "TR_edb9b026",
       "parent": "CharacterisationTechnique",
       "child": "Osmometry"
     },
     {
-      "ID": "TR_94a7d0b4",
+      "ID": "TR_3f194942",
       "parent": "CharacterisationTechnique",
       "child": "Porosimetry"
     },
     {
-      "ID": "TR_856d2137",
+      "ID": "TR_2e860fc7",
       "parent": "CharacterisationTechnique",
       "child": "Profilometry"
     },
     {
-      "ID": "TR_80b71322",
+      "ID": "TR_8f0c6bb0",
       "parent": "CharacterisationTechnique",
       "child": "ScatteringAndDiffraction"
     },
     {
-      "ID": "TR_27e06632",
+      "ID": "TR_2dca38c3",
       "parent": "CharacterisationTechnique",
       "child": "Spectrometry"
     },
     {
-      "ID": "TR_3783c08b",
+      "ID": "TR_62a12f17",
       "parent": "CharacterisationTechnique",
       "child": "Spectroscopy"
     },
     {
-      "ID": "TR_d3be65ae",
+      "ID": "TR_94be9020",
       "parent": "CharacterisationTechnique",
       "child": "ThermochemicalTesting"
     },
     {
-      "ID": "TR_32fd5e64",
+      "ID": "TR_29bc6c6f",
       "parent": "CharacterisationTechnique",
       "child": "Tomography"
     },
     {
-      "ID": "TR_b378ed89",
+      "ID": "TR_91d695c3",
       "parent": "CharacterisationTechnique",
       "child": "UltrasonicTesting"
     },
     {
-      "ID": "TR_7fd5818e",
+      "ID": "TR_1bbd5a74",
       "parent": "CharacterisationTechnique",
       "child": "Viscometry"
     },
     {
-      "ID": "TR_14722817",
+      "ID": "TR_feb3b0d6",
       "parent": "Amperometry",
       "child": "Chronoamperometry"
     },
     {
-      "ID": "TR_a9bdf628",
+      "ID": "TR_72a1531c",
       "parent": "Coulometry",
       "child": "Chronocoulometry"
     },
     {
-      "ID": "TR_017ef843",
+      "ID": "TR_7bd283da",
       "parent": "Coulometry",
       "child": "CoulometricTitration"
     },
     {
-      "ID": "TR_c0e24bc7",
+      "ID": "TR_c8ff4795",
       "parent": "Coulometry",
       "child": "DirectCoulometryAtControlledCurrent"
     },
     {
-      "ID": "TR_16c05468",
+      "ID": "TR_4dd34c5b",
       "parent": "Coulometry",
       "child": "DirectCoulometryAtControlledPotential"
     },
     {
-      "ID": "TR_89d76b8e",
+      "ID": "TR_4ab8ab23",
       "parent": "Potentiometry",
       "child": "Chronopotentiometry"
     },
     {
-      "ID": "TR_5e793ce4",
+      "ID": "TR_99d29491",
       "parent": "Potentiometry",
       "child": "OpenCircuitHold"
     },
     {
-      "ID": "TR_15c77c9d",
+      "ID": "TR_acb120aa",
       "parent": "MechanicalTesting",
       "child": "CompressionTesting"
     },
     {
-      "ID": "TR_a0b3449a",
+      "ID": "TR_7d53a683",
       "parent": "MechanicalTesting",
       "child": "CreepTesting"
     },
     {
-      "ID": "TR_b7d876d5",
+      "ID": "TR_7a4aaf16",
       "parent": "MechanicalTesting",
       "child": "DynamicMechanicalAnalysis"
     },
     {
-      "ID": "TR_0cd4aa02",
+      "ID": "TR_a4ee6fb6",
       "parent": "MechanicalTesting",
       "child": "FatigueTesting"
     },
     {
-      "ID": "TR_ef39b738",
+      "ID": "TR_8fed2a19",
       "parent": "MechanicalTesting",
       "child": "FibDic"
     },
     {
-      "ID": "TR_c09473e9",
+      "ID": "TR_03dfbe11",
       "parent": "MechanicalTesting",
       "child": "HardnessTesting"
     },
     {
-      "ID": "TR_24408e4b",
+      "ID": "TR_ee99c45b",
       "parent": "MechanicalTesting",
       "child": "Nanoindentation"
     },
     {
-      "ID": "TR_dc768db1",
+      "ID": "TR_fa69b320",
       "parent": "MechanicalTesting",
       "child": "ShearOrTorsionTesting"
     },
     {
-      "ID": "TR_7d8281ed",
+      "ID": "TR_8c42cddd",
       "parent": "MechanicalTesting",
       "child": "TensileTesting"
     },
     {
-      "ID": "TR_1be74dd5",
+      "ID": "TR_106ea010",
       "parent": "MechanicalTesting",
       "child": "ThreePointBendingTesting"
     },
     {
-      "ID": "TR_a7f3cd15",
+      "ID": "TR_eae1a367",
       "parent": "MechanicalTesting",
       "child": "WearTesting"
     },
     {
-      "ID": "TR_436f39ec",
+      "ID": "TR_42ae0f22",
       "parent": "Conductometry",
       "child": "ConductometricTitration"
     },
     {
-      "ID": "TR_6da24b98",
+      "ID": "TR_dcfb489e",
       "parent": "Chromatography",
       "child": "CriticalAndSupercriticalChromatography"
     },
     {
-      "ID": "TR_b68434bb",
+      "ID": "TR_ff3bdbbc",
       "parent": "Chromatography",
       "child": "IonChromatography"
     },
     {
-      "ID": "TR_19bde196",
+      "ID": "TR_b93cc71f",
       "parent": "Chronopotentiometry",
       "child": "CyclicChronopotentiometry"
     },
     {
-      "ID": "TR_b07c3b35",
+      "ID": "TR_6a7bbe01",
       "parent": "Chronopotentiometry",
       "child": "DirectCurrentInternalResistance"
     },
     {
-      "ID": "TR_af2a4078",
+      "ID": "TR_1b43d37d",
       "parent": "Chronopotentiometry",
       "child": "GalvanostaticIntermittentTitrationTechnique"
     },
     {
-      "ID": "TR_479d2dcb",
+      "ID": "TR_3b5c780c",
       "parent": "Chronopotentiometry",
       "child": "HPPC"
     },
     {
-      "ID": "TR_73608aac",
+      "ID": "TR_f96f209d",
       "parent": "Chronopotentiometry",
       "child": "ICI"
     },
     {
-      "ID": "TR_ada89e17",
+      "ID": "TR_7253dbb3",
       "parent": "Chronopotentiometry",
       "child": "LinearChronopotentiometry"
     },
     {
-      "ID": "TR_7c64b4b9",
+      "ID": "TR_bae04dfb",
       "parent": "Chronopotentiometry",
       "child": "PseudoOpenCircuitVoltageMethod"
     },
     {
-      "ID": "TR_f39dda53",
+      "ID": "TR_2d305ee2",
       "parent": "Chronopotentiometry",
       "child": "StepChronopotentiometry"
     },
     {
-      "ID": "TR_73bbbf68",
+      "ID": "TR_897f44e3",
       "parent": "DataPreparation",
       "child": "DataFiltering"
     },
     {
-      "ID": "TR_c2a3cc0d",
+      "ID": "TR_f884089b",
       "parent": "DataPreparation",
       "child": "DataNormalisation"
     },
     {
-      "ID": "TR_41b77557",
+      "ID": "TR_1083ab4b",
       "parent": "Spectroscopy",
       "child": "DielectricAndImpedanceSpectroscopy"
     },
     {
-      "ID": "TR_864398e9",
+      "ID": "TR_483b9bb6",
       "parent": "Spectroscopy",
       "child": "DynamicMechanicalSpectroscopy"
     },
     {
-      "ID": "TR_11d3ee38",
+      "ID": "TR_13c28959",
       "parent": "Spectroscopy",
       "child": "EnergyDispersiveXraySpectroscopy"
     },
     {
-      "ID": "TR_edbbb896",
+      "ID": "TR_aedb593c",
       "parent": "Spectroscopy",
       "child": "Exafs"
     },
     {
-      "ID": "TR_c93fc5af",
+      "ID": "TR_f2c48e88",
       "parent": "Spectroscopy",
       "child": "FourierTransformInfraredSpectroscopy"
     },
     {
-      "ID": "TR_671deb00",
+      "ID": "TR_028105fe",
       "parent": "Spectroscopy",
       "child": "NeutronSpinEchoSpectroscopy"
     },
     {
-      "ID": "TR_10c7b975",
+      "ID": "TR_8c16e7ce",
       "parent": "Spectroscopy",
       "child": "Nexafs"
     },
     {
-      "ID": "TR_e536cd07",
+      "ID": "TR_5fef0217",
       "parent": "Spectroscopy",
       "child": "NuclearMagneticResonance"
     },
     {
-      "ID": "TR_ed80582a",
+      "ID": "TR_abe43500",
       "parent": "Spectroscopy",
       "child": "RamanSpectroscopy"
     },
     {
-      "ID": "TR_925c3db5",
+      "ID": "TR_8a20cb75",
       "parent": "Spectroscopy",
       "child": "UltravioletVisibleSpectroscopy"
     },
     {
-      "ID": "TR_8f37e237",
+      "ID": "TR_0d3b2840",
       "parent": "Spectroscopy",
       "child": "XpsVariableKinetic"
     },
     {
-      "ID": "TR_28cf7609",
+      "ID": "TR_6be0f694",
       "parent": "DifferentialPulseVoltammetry",
       "child": "DifferentialLinearPulseVoltammetry"
     },
     {
-      "ID": "TR_6ac74a2e",
+      "ID": "TR_c88397cc",
       "parent": "DifferentialPulseVoltammetry",
       "child": "DifferentialStaircasePulseVoltammetry"
     },
     {
-      "ID": "TR_4963879b",
+      "ID": "TR_cab7f901",
       "parent": "OpticalTesting",
       "child": "DifferentialRefractiveIndex"
     },
     {
-      "ID": "TR_c263d48e",
+      "ID": "TR_b25526f0",
       "parent": "OpticalTesting",
       "child": "DynamicLightScattering"
     },
     {
-      "ID": "TR_26cdd11a",
+      "ID": "TR_71ab10b1",
       "parent": "OpticalTesting",
       "child": "Ellipsometry"
     },
     {
-      "ID": "TR_1dd29c9a",
+      "ID": "TR_8380aad8",
       "parent": "OpticalTesting",
       "child": "Fractography"
     },
     {
-      "ID": "TR_1c102a2b",
+      "ID": "TR_63e8f359",
       "parent": "OpticalTesting",
       "child": "LightScattering"
     },
     {
-      "ID": "TR_a3a3fd11",
+      "ID": "TR_a0a6c36f",
       "parent": "Impedimetry",
       "child": "ElectrochemicalImpedanceSpectroscopy"
     },
     {
-      "ID": "TR_92d1d7b4",
+      "ID": "TR_f626d23d",
       "parent": "Electrogravimetry",
       "child": "ElectrochemicalPiezoelectricMicrogravimetry"
     },
     {
-      "ID": "TR_9624c4a1",
+      "ID": "TR_38b800bb",
       "parent": "ChargeDistribution",
       "child": "ElectrochemicalTesting"
     },
     {
-      "ID": "TR_59e60227",
+      "ID": "TR_253f971a",
       "parent": "ChargeDistribution",
       "child": "PulsedElectroacousticMethod"
     },
     {
-      "ID": "TR_e3bbd748",
+      "ID": "TR_0d6b2a14",
       "parent": "ScanningElectronMicroscopy",
       "child": "ElectronBackscatterDiffraction"
     },
     {
-      "ID": "TR_ed969a4f",
+      "ID": "TR_4cc5d59b",
       "parent": "ScatteringAndDiffraction",
       "child": "ElectronBackscatterDiffraction"
     },
     {
-      "ID": "TR_b7746672",
+      "ID": "TR_7190511e",
       "parent": "ScanningElectronMicroscopy",
       "child": "ElectronBackscatterDiffraction"
     },
     {
-      "ID": "TR_fbb3cda1",
+      "ID": "TR_43cfb0a3",
       "parent": "ScatteringAndDiffraction",
       "child": "ElectronBackscatterDiffraction"
     },
     {
-      "ID": "TR_9e51a774",
+      "ID": "TR_5ad0853b",
       "parent": "ScatteringAndDiffraction",
       "child": "Synchrotron"
     },
     {
-      "ID": "TR_62217625",
+      "ID": "TR_fed93d97",
       "parent": "ScatteringAndDiffraction",
       "child": "XrayDiffraction"
     },
     {
-      "ID": "TR_91fb6773",
+      "ID": "TR_3f194824",
       "parent": "ScatteringAndDiffraction",
       "child": "XrdGrazingIncidence"
     },
     {
-      "ID": "TR_f949fdcb",
+      "ID": "TR_6299ab46",
       "parent": "Osmometry",
       "child": "FreezingPointDepressionOsmometry"
     },
     {
-      "ID": "TR_8d6197f1",
+      "ID": "TR_0d8d7492",
       "parent": "Osmometry",
       "child": "MembraneOsmometry"
     },
     {
-      "ID": "TR_31f474c6",
+      "ID": "TR_0b624500",
       "parent": "Osmometry",
       "child": "VaporPressureDepressionOsmometry"
     },
     {
-      "ID": "TR_c72a64a0",
+      "ID": "TR_8e764850",
       "parent": "Porosimetry",
       "child": "GasAdsorptionPorosimetry"
     },
     {
-      "ID": "TR_e36b2678",
+      "ID": "TR_b25434a5",
       "parent": "Porosimetry",
       "child": "MercuryPorosimetry"
     },
     {
-      "ID": "TR_a095f4a1",
+      "ID": "TR_960953fb",
       "parent": "SamplePreparation",
       "child": "Grinding"
     },
     {
-      "ID": "TR_327006f5",
+      "ID": "TR_4f01f264",
       "parent": "SamplePreparation",
       "child": "Milling"
     },
     {
-      "ID": "TR_7a2c8e99",
+      "ID": "TR_d8fd0989",
       "parent": "SamplePreparation",
       "child": "Mounting"
     },
     {
-      "ID": "TR_9414d15c",
+      "ID": "TR_b162cd1e",
       "parent": "SamplePreparation",
       "child": "Polishing"
     },
     {
-      "ID": "TR_a80e3711",
+      "ID": "TR_a356054a",
       "parent": "SamplePreparation",
       "child": "SamplePreparationByCutting"
     },
     {
-      "ID": "TR_222f4c88",
+      "ID": "TR_63dcb3a6",
       "parent": "CharacterisationProcedure",
       "child": "MeasurementSystemAdjustment"
     },
     {
-      "ID": "TR_c79134be",
+      "ID": "TR_db05489d",
       "parent": "SamplePreparation",
       "child": "Mounting"
     },
     {
-      "ID": "TR_cae95e45",
+      "ID": "TR_c29f9ff8",
       "parent": "DataFiltering",
       "child": "OutlierRemoval"
     },
     {
-      "ID": "TR_482a6762",
+      "ID": "TR_05b09a7e",
       "parent": "CharacterisationData",
       "child": "RawData"
     },
     {
-      "ID": "TR_5c69bd5d",
+      "ID": "TR_e9e5d29c",
       "parent": "CharacterisationProcedure",
       "child": "SampleExtraction"
     },
     {
-      "ID": "TR_398eeb58",
+      "ID": "TR_135eb56a",
       "parent": "CharacterisationProcedure",
       "child": "SampleExtraction"
     },
     {
-      "ID": "TR_e37fcb27",
+      "ID": "TR_ffcac3e9",
       "parent": "SampleExtraction",
       "child": "SampleExtractionByCutting"
     },
     {
-      "ID": "TR_2b1d177c",
+      "ID": "TR_91d706d2",
       "parent": "SamplePreparation",
       "child": "SamplePreparationByCutting"
     },
     {
-      "ID": "TR_a8c0297e",
+      "ID": "TR_f7a48f3e",
       "parent": "SampleExtraction",
       "child": "SampleExtractionByCutting"
     },
     {
-      "ID": "TR_721e9019",
+      "ID": "TR_8bfe206b",
       "parent": "CharacterisationProcedure",
       "child": "SampleInspection"
     },
     {
-      "ID": "TR_adac564f",
+      "ID": "TR_745f0286",
       "parent": "CharacterisationProcedure",
       "child": "SampleInspection"
     },
     {
-      "ID": "TR_8ab57a6e",
+      "ID": "TR_dcafa36a",
       "parent": "CharacterisationProcedure",
       "child": "SampleInspection"
     },
     {
-      "ID": "TR_d36a1414",
+      "ID": "TR_880bf5ed",
       "parent": "CharacterisationProcedure",
       "child": "SampleInspection"
     },
     {
-      "ID": "TR_e09eefc3",
+      "ID": "TR_671468d1",
       "parent": "CharacterisationProcedure",
       "child": "SamplePreparation"
     },
     {
-      "ID": "TR_888f46e4",
+      "ID": "TR_7c7532ce",
       "parent": "CharacterisationProcedure",
       "child": "SamplePreparation"
     },
     {
-      "ID": "TR_6b6feea2",
+      "ID": "TR_74c42cb3",
       "parent": "CharacterisationProcedure",
       "child": "SamplePreparation"
     },
     {
-      "ID": "TR_2b546462",
+      "ID": "TR_d1c74c6d",
       "parent": "CharacterisationProcedure",
       "child": "SamplePreparation"
     },
     {
-      "ID": "TR_c062bcee",
+      "ID": "TR_58ad0bf7",
       "parent": "DCPolarography",
       "child": "SampledDCPolarography"
     },
     {
-      "ID": "TR_ba19c415",
+      "ID": "TR_238149e3",
       "parent": "HydrodynamicVoltammetry",
       "child": "VoltammetryAtARotatingDiskElectrode"
     },
     {
-      "ID": "TR_1cce87c5",
+      "ID": "TR_e5e55d82",
       "parent": "XrayDiffraction",
       "child": "XrayPowderDiffraction"
     }

cifcore/cifcore.rst

@@ -1,4 +1,4 @@
-Crystallographic Information Framework (CIF) Core Dictionary (CIFCore)
+Crystallographic Information Framework Core Dictionary (CIFCore)
 ========================================================================================================================
 
 Overview
@@ -14,7 +14,7 @@ some of the more complex types of information that can be handled with this appr
 :Creator: None
 :License: Creative Commons Attribution 4.0 International (CC BY 4.0)
 :Format: TTL
-:Download: `Crystallographic Information Framework (CIF) Core Dictionary (CIFCore) Homepage <https://github.com/emmo-repo/CIF-ontology?tab=readme-ov-file>`_
+:Download: `Crystallographic Information Framework Core Dictionary (CIFCore) Homepage <https://github.com/emmo-repo/CIF-ontology?tab=readme-ov-file>`_
 
 Graph Metrics
 -------------

cmso/type_non_taxonomic_relations.json

@@ -7,7 +7,7 @@
   ],
   "non_taxonomies": [
     {
-      "ID": "NR_a664dce1",
+      "ID": "NR_f4cb1fd2",
       "head": "Material",
       "tail": "Material",
       "relation": "equivalentClass"

cmso/type_taxonomies.json

@@ -1,144 +1,144 @@
 {
   "types": [
-    "Angle",
-    "Atomic Velocity",
-    "Crystalline Material",
-    "Crystal Structure",
-    "Plane",
+    "Chemical Species",
     "Atomic Scale Sample",
-    "Normal Vector",
-    "Atomic Position",
-    "Atom Attribute",
-    "Computational Sample",
-    "Coordination Number",
     "Material",
+    "Occupancy",
+    "Simulation Cell Angle",
+    "Macroscale Sample",
+    "Simulation Cell Vector",
     "Amorphous Material",
     "Vector",
-    "Molecule",
-    "Occupancy",
-    "Microstructure",
-    "Chemical Species",
-    "Atom",
+    "Computational Sample",
+    "Plane",
     "Lattice Vector",
+    "Coordination Number",
+    "Structure",
+    "Atom",
+    "Nanoscale Sample",
     "Lattice Plane",
+    "Atomic Velocity",
     "Lattice Angle",
     "Microscale Sample",
-    "Nanoscale Sample",
-    "Structure",
-    "Simulation Cell Angle",
+    "Atom Attribute",
+    "Microstructure",
+    "Crystal Structure",
+    "Crystalline Material",
     "Mesoscale Sample",
+    "Atomic Position",
+    "Molecule",
+    "Normal Vector",
     "Atomic Force",
-    "Macroscale Sample",
-    "Simulation Cell Vector"
+    "Angle"
   ],
   "taxonomies": [
     {
-      "ID": "TR_f90d9504",
+      "ID": "TR_a085ecb2",
       "parent": "Material",
       "child": "Crystalline Material"
     },
     {
-      "ID": "TR_1fc7e1f5",
+      "ID": "TR_cd3b2ae1",
       "parent": "Material",
       "child": "Amorphous Material"
     },
     {
-      "ID": "TR_572ff4c7",
+      "ID": "TR_947ed6c7",
       "parent": "Chemical Species",
       "child": "Atom"
     },
     {
-      "ID": "TR_c3ecca6c",
+      "ID": "TR_aaf0deb6",
       "parent": "Chemical Species",
       "child": "Molecule"
     },
     {
-      "ID": "TR_41e4393e",
+      "ID": "TR_f22a3488",
       "parent": "Atom Attribute",
       "child": "Atomic Force"
     },
     {
-      "ID": "TR_d46e7253",
+      "ID": "TR_4d7b8388",
       "parent": "Atom Attribute",
       "child": "Atomic Position"
     },
     {
-      "ID": "TR_b62003e0",
+      "ID": "TR_4b99a806",
       "parent": "Atom Attribute",
       "child": "Atomic Velocity"
     },
     {
-      "ID": "TR_e8b8bc14",
+      "ID": "TR_d3f062b4",
       "parent": "Atom Attribute",
       "child": "Coordination Number"
     },
     {
-      "ID": "TR_087aa9b0",
+      "ID": "TR_309c98a6",
       "parent": "Atom Attribute",
       "child": "Occupancy"
     },
     {
-      "ID": "TR_48b8b7fb",
+      "ID": "TR_4146419a",
       "parent": "Computational Sample",
       "child": "Atomic Scale Sample"
     },
     {
-      "ID": "TR_34c77477",
+      "ID": "TR_4398598b",
       "parent": "Computational Sample",
       "child": "Macroscale Sample"
     },
     {
-      "ID": "TR_8ca4a5d8",
+      "ID": "TR_6fa0f685",
       "parent": "Computational Sample",
       "child": "Mesoscale Sample"
     },
     {
-      "ID": "TR_8d17bb09",
+      "ID": "TR_17b80a7f",
       "parent": "Computational Sample",
       "child": "Microscale Sample"
     },
     {
-      "ID": "TR_996de884",
+      "ID": "TR_41f00c71",
       "parent": "Computational Sample",
       "child": "Nanoscale Sample"
     },
     {
-      "ID": "TR_ad54033e",
+      "ID": "TR_0eaa8e1f",
       "parent": "Structure",
       "child": "Crystal Structure"
     },
     {
-      "ID": "TR_ab6080da",
+      "ID": "TR_d2e9a69d",
       "parent": "Structure",
       "child": "Microstructure"
     },
     {
-      "ID": "TR_1f0add2d",
+      "ID": "TR_f034d166",
       "parent": "Angle",
       "child": "Lattice Angle"
     },
     {
-      "ID": "TR_32859b7d",
+      "ID": "TR_9df7df16",
       "parent": "Angle",
       "child": "Simulation Cell Angle"
     },
     {
-      "ID": "TR_330307f5",
+      "ID": "TR_d34dd999",
       "parent": "Plane",
       "child": "Lattice Plane"
     },
     {
-      "ID": "TR_7584f576",
+      "ID": "TR_c66dab3f",
       "parent": "Vector",
       "child": "Lattice Vector"
     },
     {
-      "ID": "TR_65fac860",
+      "ID": "TR_a4c287d6",
       "parent": "Vector",
       "child": "Normal Vector"
     },
     {
-      "ID": "TR_5e0d8ea2",
+      "ID": "TR_4c655e2e",
       "parent": "Vector",
       "child": "Simulation Cell Vector"
     }

dataset_infos.json

@@ -43,7 +43,6 @@
     "MSEO",
     "MSLE",
     "NanoMine",
-    "OIECharacterisation",
     "OIEManufacturing",
     "OIEMaterials",
     "OIEModels",

diso/type_non_taxonomic_relations.json

@@ -16,37 +16,37 @@
   ],
   "non_taxonomies": [
     {
-      "ID": "NR_522bfe5e",
-      "head": "Edge Dislocation",
-      "tail": "Screw Dislocation",
+      "ID": "NR_c91755c5",
+      "head": "Family of Crystal Direction",
+      "tail": "Family of Crystal Plane",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_efeb5f71",
-      "head": "Node",
-      "tail": "Segment",
+      "ID": "NR_914a1abe",
+      "head": "Line",
+      "tail": "Node",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_3c99117e",
-      "head": "Family of Crystal Direction",
-      "tail": "Family of Crystal Plane",
+      "ID": "NR_d5348594",
+      "head": "Node",
+      "tail": "Segment",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_df9a3561",
+      "ID": "NR_14c6eb8b",
       "head": "Discretized Line",
       "tail": "Line",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_42a6605e",
-      "head": "Line",
-      "tail": "Node",
+      "ID": "NR_bc628ec5",
+      "head": "Edge Dislocation",
+      "tail": "Screw Dislocation",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_6380a794",
+      "ID": "NR_420d45ca",
       "head": "Field Ion Microscopy",
       "tail": "Transmission Electron Microscopy",
       "relation": "disjointWith"

diso/type_taxonomies.json

@@ -1,215 +1,215 @@
 {
   "types": [
-    "Position Vector",
-    "Slip Plane Normal",
-    "Screw Dislocation",
     "Burgers Vector",
-    "Crystallographic Defect",
-    "Family of Crystal Plane",
-    "Vector Origin",
-    "Slip Direction",
-    "Lattice Point",
+    "Family of Crystal Direction",
     "Vector Component of Basis",
-    "Line Defect",
-    "Node",
     "Slip Plane",
     "Vector",
-    "Lattice Direction",
-    "Family of Crystal Direction",
+    "Screw Dislocation",
+    "Line Defect",
     "Dislocation",
+    "Lattice Point",
+    "Vector Origin",
+    "Crystallographic Defect",
     "Quantity",
     "Lattice Plane",
+    "Slip Direction",
+    "Lattice Direction",
+    "Slip Plane Normal",
+    "Point",
+    "Position Vector",
+    "Node",
     "Edge Dislocation",
-    "Point"
+    "Family of Crystal Plane"
   ],
   "taxonomies": [
     {
-      "ID": "TR_9fec9de6",
+      "ID": "TR_535ced4d",
       "parent": "Vector",
       "child": "Position Vector"
     },
     {
-      "ID": "TR_eb07ece5",
+      "ID": "TR_d8f19699",
       "parent": "Vector",
       "child": "Burgers Vector"
     },
     {
-      "ID": "TR_174f0d9d",
+      "ID": "TR_5776fdc4",
       "parent": "Vector",
       "child": "Lattice Direction"
     },
     {
-      "ID": "TR_45718a6f",
+      "ID": "TR_5a8b63ed",
       "parent": "Family of Crystal Direction",
       "child": "Lattice Direction"
     },
     {
-      "ID": "TR_971d1737",
+      "ID": "TR_cdc8a00b",
       "parent": "Vector",
       "child": "Slip Plane Normal"
     },
     {
-      "ID": "TR_78cba00e",
+      "ID": "TR_0d08f2c5",
       "parent": "Quantity",
       "child": "Vector Component of Basis"
     },
     {
-      "ID": "TR_27f3b8df",
+      "ID": "TR_f9458218",
       "parent": "Quantity",
       "child": "Vector Component of Basis"
     },
     {
-      "ID": "TR_8f9dd296",
+      "ID": "TR_0e8febfc",
       "parent": "Quantity",
       "child": "Vector Component of Basis"
     },
     {
-      "ID": "TR_cb2364ae",
+      "ID": "TR_21c786b2",
       "parent": "Line Defect",
       "child": "Dislocation"
     },
     {
-      "ID": "TR_20e1b558",
+      "ID": "TR_1674a2ee",
       "parent": "Line Defect",
       "child": "Dislocation"
     },
     {
-      "ID": "TR_bea25977",
+      "ID": "TR_a805b97b",
       "parent": "Line Defect",
       "child": "Dislocation"
     },
     {
-      "ID": "TR_8f29e94c",
+      "ID": "TR_0b536412",
       "parent": "Line Defect",
       "child": "Dislocation"
     },
     {
-      "ID": "TR_a698b24b",
+      "ID": "TR_b2648c2d",
       "parent": "Line Defect",
       "child": "Dislocation"
     },
     {
-      "ID": "TR_de3b6348",
+      "ID": "TR_587d1515",
       "parent": "Line Defect",
       "child": "Dislocation"
     },
     {
-      "ID": "TR_c9280414",
+      "ID": "TR_09193c67",
       "parent": "Line Defect",
       "child": "Dislocation"
     },
     {
-      "ID": "TR_73e6de7c",
+      "ID": "TR_e22e3adb",
       "parent": "Line Defect",
       "child": "Dislocation"
     },
     {
-      "ID": "TR_7e5da611",
+      "ID": "TR_765a4566",
       "parent": "Dislocation",
       "child": "Edge Dislocation"
     },
     {
-      "ID": "TR_5f4d8e4a",
+      "ID": "TR_502b98d2",
       "parent": "Dislocation",
       "child": "Screw Dislocation"
     },
     {
-      "ID": "TR_bf00f9c3",
+      "ID": "TR_b2f43256",
       "parent": "Vector",
       "child": "Lattice Direction"
     },
     {
-      "ID": "TR_a649ea63",
+      "ID": "TR_a1529f18",
       "parent": "Family of Crystal Direction",
       "child": "Lattice Direction"
     },
     {
-      "ID": "TR_06a435e5",
+      "ID": "TR_1bc1fa4b",
       "parent": "Vector",
       "child": "Lattice Direction"
     },
     {
-      "ID": "TR_4ea8fb27",
+      "ID": "TR_1484ef39",
       "parent": "Family of Crystal Direction",
       "child": "Lattice Direction"
     },
     {
-      "ID": "TR_71a386f2",
+      "ID": "TR_c28fd534",
       "parent": "Vector",
       "child": "Lattice Direction"
     },
     {
-      "ID": "TR_a9536936",
+      "ID": "TR_b8d28d94",
       "parent": "Family of Crystal Direction",
       "child": "Lattice Direction"
     },
     {
-      "ID": "TR_ac3651c2",
+      "ID": "TR_fad9d05f",
       "parent": "Family of Crystal Plane",
       "child": "Lattice Plane"
     },
     {
-      "ID": "TR_13f0d44e",
+      "ID": "TR_74a0dc47",
       "parent": "Family of Crystal Plane",
       "child": "Lattice Plane"
     },
     {
-      "ID": "TR_89e99e17",
+      "ID": "TR_481b0116",
       "parent": "Family of Crystal Plane",
       "child": "Lattice Plane"
     },
     {
-      "ID": "TR_a393a667",
+      "ID": "TR_56b4098c",
       "parent": "Family of Crystal Plane",
       "child": "Lattice Plane"
     },
     {
-      "ID": "TR_54a7a013",
+      "ID": "TR_e27dd7e9",
       "parent": "Family of Crystal Plane",
       "child": "Lattice Plane"
     },
     {
-      "ID": "TR_6c265109",
+      "ID": "TR_aa04df96",
       "parent": "Point",
       "child": "Lattice Point"
     },
     {
-      "ID": "TR_f985f57d",
+      "ID": "TR_f98732f1",
       "parent": "Point",
       "child": "Node"
     },
     {
-      "ID": "TR_7ee145f6",
+      "ID": "TR_ebe52681",
       "parent": "Point",
       "child": "Vector Origin"
     },
     {
-      "ID": "TR_8fd30513",
+      "ID": "TR_a30fafba",
       "parent": "Crystallographic Defect",
       "child": "Line Defect"
     },
     {
-      "ID": "TR_af2dfef6",
+      "ID": "TR_21fbcb13",
       "parent": "Lattice Direction",
       "child": "Slip Direction"
     },
     {
-      "ID": "TR_1c2f66f2",
+      "ID": "TR_ce35b39c",
       "parent": "Lattice Plane",
       "child": "Slip Plane"
     },
     {
-      "ID": "TR_651e96da",
+      "ID": "TR_4bccbe85",
       "parent": "Lattice Plane",
       "child": "Slip Plane"
     },
     {
-      "ID": "TR_a17326fe",
+      "ID": "TR_4704bc22",
       "parent": "Lattice Plane",
       "child": "Slip Plane"
     },
     {
-      "ID": "TR_c4e1a292",
+      "ID": "TR_1e150695",
       "parent": "Vector",
       "child": "Slip Plane Normal"
     }

dsim/type_non_taxonomic_relations.json

@@ -13,39 +13,39 @@
   ],
   "non_taxonomies": [
     {
-      "ID": "NR_c18017f0",
-      "head": "Line",
-      "tail": "Node",
+      "ID": "NR_aaba13c1",
+      "head": "Cross Slip",
+      "tail": "External Load Parameter",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_a319ac8c",
-      "head": "Line",
-      "tail": "Discretized Line",
+      "ID": "NR_8e1cae0e",
+      "head": "Node",
+      "tail": "Segment",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_c4528feb",
-      "head": "Node",
-      "tail": "Segment",
+      "ID": "NR_23d719cb",
+      "head": "External Load Parameter",
+      "tail": "Junction Formation",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_6e316071",
-      "head": "Cross Slip",
-      "tail": "External Load Parameter",
+      "ID": "NR_cb4b632d",
+      "head": "Line",
+      "tail": "Discretized Line",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_457c0753",
+      "ID": "NR_d57c0d8f",
       "head": "Cross Slip",
       "tail": "Junction Formation",
       "relation": "disjointWith"
     },
     {
-      "ID": "NR_73fc4ed0",
-      "head": "External Load Parameter",
-      "tail": "Junction Formation",
+      "ID": "NR_57f5038a",
+      "head": "Line",
+      "tail": "Node",
       "relation": "disjointWith"
     }
   ]